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Narrow-beam X-ray tests of CCD edge response

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Abstract

The physical boundaries of a fully-depleted CCD can lead to distorted field lines and non-uniform response. We study this response with a beam of X-rays constrained to a width of less than one pixel (15 \(\upmu\)m), and a system to map the CCD response as a function of transverse position.

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Acknowledgements

We wish to thank Patricia Fernandez and Jozef Maj for making the X-ray facility available. We also thank Steve Holland for critical discussions and references about the engineering models of the CCDs. Finally, we thank Juan Estrada, Donna Kubik, and Tom Diehl for useful discussions and information, as well as access to the DES CCDs.

The submitted manuscript has been created by UChicago Argonne, LLC, Operator of Argonne National Laboratory (“Argonne”). Argonne, a U.S. Department of Energy Office of Science laboratory, is operated under Contract No. DE-AC02-06CH11357. The U.S. Government retains for itself, and others acting on its behalf, a paid-up nonexclusive, irrevocable worldwide license in said article to reproduce, prepare derivative works, distribute copies to the public, and perform publicly and display publicly, by or on behalf of the Government.

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Authors and Affiliations

  1. Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL, 60439, USA

    Stephen Kuhlmann, Harold Spinka, Joseph P. Bernstein, Kevin A. Beyer, Lisa M. Gades, Thomas E. Kasprzyk, Antonino Miceli, Richard A. Spence & Richard Talaga

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  1. Stephen Kuhlmann
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  2. Harold Spinka
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  3. Joseph P. Bernstein
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  4. Kevin A. Beyer
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  5. Lisa M. Gades
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  6. Thomas E. Kasprzyk
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  7. Antonino Miceli
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  8. Richard A. Spence
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  9. Richard Talaga
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Correspondence to Stephen Kuhlmann.

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Kuhlmann, S., Spinka, H., Bernstein, J.P. et al. Narrow-beam X-ray tests of CCD edge response. Exp Astron 29, 135–144 (2011). https://doi.org/10.1007/s10686-010-9204-3

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  • DOI: https://doi.org/10.1007/s10686-010-9204-3

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