Abstract
The reflectivity variations of a dielectric thin film during the deposition of a disordered monolayer of metallic nanoparticles are studied. We present experimental results and provide theoretical physical insight into the behavior of the reflectivity signal and its dependence on the dielectric thin-film thickness and structural features of the monolayer of nanoparticles. A closed-form expression is used to describe the reflectivity of a disordered monolayer of particles on a flat substrate within the frame of a coherent-scattering model approach. It is shown that the model reproduces qualitatively the behavior of the reflectivity signal during the experiment. Finally we study the optical response in the limit of small particles for low surface coverage fractions of the monolayer to evidence the main parameters that dictate the evolution of the reflectivity signal during the growth of a monolayer of nanoparticles.
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Acknowledgements
We acknowledge financial support from Dirección General de Asuntos del Personal Académico from Universidad Nacional Autónoma de México through grants IN-120309 and from Consejo Nacional de Ciencia y Tecnología (México) through grants 49482F. This work was also partially supported by the EU under project FP7-NMP-2010-Eu-Mexico Grant Agreement No 263878: Functionalities of Bismuth based Nanostructures (BisNano), by the Spanish CICYT under project MAT2009-14369-C02-02, and by CSIC- CONACYT-2008MX0050 collaborative action. J.T. acknowledges a Juan de la Cierva Grant No JCI-2009-05098.
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A. García-Valenzuela on sabbatical leave from: Centro de Ciencias Aplicadas y Desarrollo Tecnológico, Universidad Nacional Autónoma de México, Apartado Postal 76-186, Distrito Federal.
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García-Valenzuela, A., Haro-Poniatowski, E., Toudert, J. et al. Evolution of the optical reflectivity of a monolayer of nanoparticles during its growth on a dielectric thin film. Appl. Phys. A 110, 757–764 (2013). https://doi.org/10.1007/s00339-012-7167-0
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DOI: https://doi.org/10.1007/s00339-012-7167-0