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The AES and micro-raman characteristics of diamond thin films grown by EACVD as the nucleation free energy increases

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Electronic Thin Film Science Lab, Material Evaluation Center, Korea Research Institute of Standards and Science, Taeduck Science Town, Taejon, Korea

    C. R. Lee & J. Y. Leem

  2. RASOM, Engineering college, Chungnam National University, Taeduck Science Town, Taejon, Korea

    B. S. Chun

Authors
  1. C. R. Lee
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  2. J. Y. Leem
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  3. B. S. Chun
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Lee, C.R., Leem, J.Y. & Chun, B.S. The AES and micro-raman characteristics of diamond thin films grown by EACVD as the nucleation free energy increases. J Mater Sci Lett 14, 361–365 (1995). https://doi.org/10.1007/BF00592150

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  • DOI: https://doi.org/10.1007/BF00592150

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