Abstract
In the 1980s, the invention of scanning tunneling microscope (STM) opened the door to observe the world from the atomic scale. For STM, good resolution is considered to be 0.1 nm lateral resolution and 0.01 nm (10 pm) depth resolution. With this resolution, individual atoms within materials are routinely imaged and manipulated.
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Liu, M. (2018). STM Study of Twisted Bilayer Graphene. In: Controlled Synthesis and Scanning Tunneling Microscopy Study of Graphene and Graphene-Based Heterostructures. Springer Theses. Springer, Singapore. https://doi.org/10.1007/978-981-10-5181-4_3
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DOI: https://doi.org/10.1007/978-981-10-5181-4_3
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