Skip to main content

A Study on OPNET State Machine Model Based IoT Network Layer Test

  • Conference paper
  • First Online:
Information Science and Applications 2017 (ICISA 2017)

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 424))

Included in the following conference series:

Abstract

Model based testing can enable automated test case generation for many kind of application. Even test code can be generated from the model by specialized tools. IoT protocols for network layer have many constraints for exhaustive or manual testing because of battery problem and large number of sensor nodes. To solve these testing constraints, this paper proposes an efficient State Machine based test case generation for IoT network layer by using OPNET simulation model and test case generation tool. The size of test suite is compared according to the size of State Machine model from OPNET.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 259.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 329.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 329.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Gansner, E., North, S.: An open graph visualization system and its Appl. Soft. Pract. Experience 30, 1203–1233 (1999)

    Article  MATH  Google Scholar 

  2. Javed, A., Strooper, P., Watson, G.: Automated generation of test cases using model-driven architecture. In Proceedings of the 2nd International Workshop on Automation of Software Test (AST 2007), p. 3 (2007)

    Google Scholar 

  3. Link, J., Fröhlich, P.: Unit Testing in Java: How Tests Drive the Code. Morgan Kaufmann Publishers Inc., Burlington (2003)

    MATH  Google Scholar 

  4. IEEE Standards Association: IEEE standard for local and metropolitan area networks–Part 15.4: Low-Rate Wireless Personal Area Networks (LR-WPANs) (2011). http://standards.ieee.org/about/get/802/802.15.html

  5. Xiaolong, L., Peng, M.: OPNET-based modeling and simulation of mobile Zigbee sensor networks. Peer-to-Peer Netw. Appl. (2015). doi:10.1007/s12083-015-0349-8

    Google Scholar 

  6. http://www.cs.waikato.ac.nz/~marku/mbt/modeljunit/ (2016)

  7. Utting, M., Legeard, B.: Practical Model-Based Testing: A Tools Approach, pp. 157–162. Morgan Kaufmann Publishers Inc., San Francisco (2007)

    Google Scholar 

  8. Lelis, L., Pedrosa, C.: A new method for incremental testing of finite state machines. In: NFM2010

    Google Scholar 

  9. Ural, H.: Formal methods for test sequence generation. Comput. Commun. 15(5), 311–325 (1992)

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Young-hwan Ham .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2017 Springer Nature Singapore Pte Ltd.

About this paper

Cite this paper

Ham, Yh., Jung, Ht., Kim, Hc., Chung, Jw. (2017). A Study on OPNET State Machine Model Based IoT Network Layer Test. In: Kim, K., Joukov, N. (eds) Information Science and Applications 2017. ICISA 2017. Lecture Notes in Electrical Engineering, vol 424. Springer, Singapore. https://doi.org/10.1007/978-981-10-4154-9_5

Download citation

  • DOI: https://doi.org/10.1007/978-981-10-4154-9_5

  • Published:

  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-4153-2

  • Online ISBN: 978-981-10-4154-9

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics