Abstract
A new experiment for a high-precision measurement of the pion mass at a 1 ppm level is presented. It combines an improved cyclotron trap that produces pionic and muonic atoms in a small volume with a doubly focusing crystal spectrometer to measure the corresponding exotic X-ray transitions with high accuracy and a novel type of CCD detector. The muonic X-rays lines serve as highly accurate calibration lines. The measurement has been accomplished recently. A detailed analysis of the data is on the way.
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© 2001 Kluwer Academic Publishers
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Borchert, G.L. et al. (2001). Precision Measurement of the Charged Pion Mass by High Resolution X-Ray Spectroscopy. In: Lunney, D., Audi, G., Kluge, HJ. (eds) Atomic Physics at Accelerators: Mass Spectrometry. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-1270-1_15
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DOI: https://doi.org/10.1007/978-94-015-1270-1_15
Publisher Name: Springer, Dordrecht
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