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STM and AFM Studies of Layered Materials: General

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Surface Properties of Layered Structures

Part of the book series: Physics and Chemistry of Materials with Low-Dimensional Structures ((PCMALS,volume 16))

Abstract

In 1982, G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel [1–3] reported on the first successful vacuum tunneling experiments between a sample surface and an atomically sharp probing tip which can be raster scanned across the surface in atomic dimensions by means of piezoelectric transducers. A novel, powerful tool for studying local surface properties of conducting samples down to the atomic scale was born: the scanning tunneling microscope (STM). Since then, surface science has profited remarkably from the ability of STM to map the surface atomic and electronic structure directly in real space. For instance, several reconstructions particularly on semiconductor surfaces were solved; surface imperfections such as point defects, steps, dislocations and grain boundaries were characterized on the atomic scale; adsorbed and chemisorbed species and even the physical properties of supported clusters on fiat substrates were studied locally by STM.

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Authors and Affiliations

  1. Dept. of Physics, University of Basel, Klingelbergstrasse 82, CH-4056, Basel, Switzerland

    R. Wiesendanger & D. Anselmetti

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  1. R. Wiesendanger
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  2. D. Anselmetti
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  1. Department of Physics, University of Milan, Italy

    G. Benedek

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Wiesendanger, R., Anselmetti, D. (1992). STM and AFM Studies of Layered Materials: General. In: Benedek, G. (eds) Surface Properties of Layered Structures. Physics and Chemistry of Materials with Low-Dimensional Structures, vol 16. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-2684-7_1

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  • DOI: https://doi.org/10.1007/978-94-011-2684-7_1

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