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New techniques in microscopy

  • Chapter
Characterization of Solid Polymers

Abstract

Microscopes based on and including the scanning tunnelling microscope (STM) form a new class of instruments, collectively known as scanning probe microscopes (SPM or SXM). For their invention of the STM [1,2] in 1981, Gerd Binning and Heinrich Rohrer were awarded the 1986 Nobel Prize for Physics. In the same year, Binnig, Quate and Gerber published a description of the atomic force microscope, AFM[3]. This was the first, and remains the most important, offspring in a family of scanning probe microscopes derived from the STM concept and technology.

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  1. M. J. Miles
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Editors and Affiliations

  1. Division of Applied Physics, School of Science, Sheffield Hallam University, Sheffield, S1 1WB, UK

    S. J. Spells

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Miles, M.J. (1994). New techniques in microscopy. In: Spells, S.J. (eds) Characterization of Solid Polymers. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1262-8_2

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  • DOI: https://doi.org/10.1007/978-94-011-1262-8_2

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