Abstract
Monocrystalline silicon is still the material of first choice for robust MEMS devices, because of its excellent mechanical strength and elasticity, and the large variety of available standard processes. Conventional RF MEMS components consist of thin-film metal structures which are prone to plastic deformation and limit the power handling. The microwave MEMS devices presented in this work utilize monocrystalline silicon as the structural material of their moving parts, and even prove that high-resistivity silicon is a good dielectric material in the W-band. A very low insertion loss, mechanically multi-stable, static zero-power consuming, laterally moving microswitch concept completely integrated in a 3D micromachined transmission line is presented. Furthermore, a multi-stage phase shifter utilizing high-resistivity monocrystalline silicon as dielectric material for the MEMS-actuated moving block loading the transmission line is shown. Finally, a tuneable high-impedance surface based on distributed MEMS capacitors with a transfer-bonded monocrystalline silicon core is presented. Prototypes of these devices were fabricated and characterization results of the microwave and their actuator performance are given.
Multi-Stable Switches, W-Band Phase Shifters, and MEMS Tuneable Frequency-Selective Surfaces
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Notes
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1Except for [30] which has better performance at its nominal frequency only, but performs worse for the rest of the W-band, and is fabricated on glass substrate.
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Acknowledgments
Funding for some parts of the work is provided through the NORDITE Scandinavian ICT Programme (VINNOVA, TEKES, RCN) and the European Community's Seventh Framework Programme FP7/2007–2013 under grant agreement no. 224197.
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Oberhammer, J., Sterner, M., Somjit, N. (2010). Monocrystalline-Silicon Microwave MEMS Devices. In: Gusev, E., Garfunkel, E., Dideikin, A. (eds) Advanced Materials and Technologies for Micro/Nano-Devices, Sensors and Actuators. NATO Science for Peace and Security Series B: Physics and Biophysics. Springer, Dordrecht. https://doi.org/10.1007/978-90-481-3807-4_7
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