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Novel Application of Anomalous Small-Angle X-ray Scattering to Characterization of Condensed Matter

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Structure and Properties of Aperiodic Materials

Part of the book series: Advances in Materials Research ((ADVSMATERIALS,volume 5))

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Abstract

Small-angle X-ray scattering (hereafter referred to as SAXS) has been widely used for studying structural features of materials in various fields such as physics, chemistry, metallurgy, and biology, because SAXS data enable us to obtain important microstructural parameters such as particle volume and shape of so-called structural inhomogeneities with colloidal size [1–3]. Since SAXS signals are analyzed on the basis of coherent scattering due to electron density inhomogeneities in the sample, SAXS studies are usually made using radiation whose energy is far from an atomic absorption edge of constituent elements, where the atomic scattering factor for each element is almost proportional to the atomic number. Therefore, the conventional SAXS analysis produces a theoretical difficulty in detecting the structural inhomogeneities caused by the distribution of near-neighbor elements.

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Waseda, Y., Sugiyama, K., Shinohara, A.H. (2003). Novel Application of Anomalous Small-Angle X-ray Scattering to Characterization of Condensed Matter. In: Kawazoe, Y., Waseda, Y. (eds) Structure and Properties of Aperiodic Materials. Advances in Materials Research, vol 5. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-10116-2_2

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  • DOI: https://doi.org/10.1007/978-3-662-10116-2_2

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