Abstract
Microscopy techniques are used to produce real space magnified images of a surface showing what it looks like. In general, microscopy information concerns surface crystallography (i.e., how the atoms are arranged at the surface), surface morphology (i.e., the shape and the size of topographic features making the surface), and surface composition (the elements and compounds that the surface is composed of). The operational principles vary greatly from one type of microscopy to another and include electron-beam transmission (transmission electron microscopy) and reflection (reflection electron microscopy, low-energy electron microscopy, scanning electron microscopy), field emission of electrons (field emission microscopy, scanning tunneling microscopy) and ions (field ion microscopy), and scanning the surface by a probing electron beam (scanning electron microscopy) or a probing tip (scanning tunneling microscopy, atomic force microscopy). Most microscopy techniques used in surface science ensure resolution on the nm scale, while field ion microscopy, scanning tunneling microscopy and atomic force microscopy allow acquisition of images with atomic resolution.
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Further Reading
E.W. Müller, T.T. Tsong: Field Ion Microscopy. Principles and Applications (Elsevier, New York 1969)
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R.M. Tromp: Spectroscopy with the Scanning Tunneling Microscope: A Critical Review. J. Phys.: Condensed Matter 1, 10211–10228 (1989) (about scanning tunneling spectroscopy)
R. Wiesendanger, H.-J. Güntherodt (Ed.): Scanning Tunneling Microscopy II. Springer Series in Surface Science. Vol. 28. 2nd edn. (Springer, Berlin 1995) (a set of papers on novel applications of STM and on various scanning probe microscopy techniques)
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Oura, K., Katayama, M., Zotov, A.V., Lifshits, V.G., Saranin, A.A. (2003). Surface Analysis IV. Microscopy. In: Surface Science. Advanced Texts in Physics. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-05179-5_7
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DOI: https://doi.org/10.1007/978-3-662-05179-5_7
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