Abstract
Scattering of atoms and ions from solid surfaces is another example of the development of an excentric experiment into a very useful and important technique for material analysis. These types of experiments are the youngest in the family of spectroscopy with particles. Also, the masses of the particles used as a probe are up to two orders of magnitude larger than those for the heavy particles discussed so far. Since the penetration of the atoms and ions into the solid material can be very small very thin films or surfaces can be investigated. Hence the booming activities in surface science has naturally contributed to the development and to applications of this new analytical technique.
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References
J.R. Tesmer, M. Nastasi: Handbook of Modern Ion Beam Materials Analysis (Materials Research Society, Pittsburgh 1995)
K. Wittmack, J.B. Clegg: Appl. Phys. Lett. 37, 285 (1980)
Additional Reading
Benninghoven A., Rüdenauer F.G., Werner H.W.: Secondary Ion Mass Spectrometry, (John Wiley, New York 1987)
Briggs D., Seah M.P.: Practical Surface Analysis Volume II (John Wiley, Chichester 1992)
Tesmer J.R., Nastasi M.: Handbook of Modern Ion Beam Materials Analysis (Materials Research Society, Pittsburgh 1995)
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© 1998 Springer-Verlag Berlin Heidelberg
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Kuzmany, H. (1998). Spectroscopy with Atoms and Ions. In: Solid-State Spectroscopy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-03594-8_18
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DOI: https://doi.org/10.1007/978-3-662-03594-8_18
Publisher Name: Springer, Berlin, Heidelberg
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