Abstract
With increased complexity, test technology has become a central field in the IC design process. Any efficient IC design system must be backed by well-founded test concepts and strategies, and it must supply the relevant tools.
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Literature - Chapter 4
Johansson, M.: The GENESYS-Algorithm for ATPG Without Fault Simulation. IEEE Test Conf., 1983.
Bottorf, P. S.; France, R. E.; Garages, N. H.; Orosz, E. J.: Test Generation for Large Logic Networks. Proc. 14th Design Autom. Conf., New Orleans, 1977.
Bowder, K. R.: A Technique for Automatic Test Generation for Digital Circuits. Proc. IEEE Intercon, 1975.
Lai, K.-W.: Functional Testing of Digital Systems. Ph. D. Thesis, Department of Computer Science, Carnegie-Mellon-University, Pittsburgh 1981.
Sridhar, T.; Mayes, J. P.: A Functional Approach to Testing Bit-Sliced Micro-Processors. IEEE Trans. C-30, 1981.
Bashiera, D.; Courtois, B.: Testing CMOS: A Challenge. VLSI-Design, 1984.
Wadsack, R. L.: Fault Modeling and Logic Simulation of MOS and MOS Integrated Circuits. The Bell System Technical Journal, Vol. 57, 1978.
Eichelberger, E. B.; Williams, T. W.: A Logic Design Structure for LSI Testability. Journal DAFTC, Vol. 2, 1978.
Gerner, M.; Nertinger, H.: Scan Path in CMOS-Semicustom LSI Chips? IEEE Test Conf., 1984.
Ando, H.: Testing VLSI with Random Access Scan. Digest of Papers Compcon 80, 1980.
Funatsu, S.; Wakatsuki, N.; Yamada, A.: Easily Teastable Design of Large Digital Circuits. NEC Research and Development, No. 54, 1979.
Goldstein, L. H.: Controllability/Observability Analysis of Digital Circuits. IEEE Trans-actions on Circuits and Systems, Vol. LAS-26, No. 9, 1979.
Thomas, J. J.: Automated Diagnostic Test Programm for Digital Networks, Computer Design, Vol. 10, No. 8, 1971.
Armstrong, D. B.: On Finding a Nearly Minimal Set of Fault Detection Tests for Combi-natorial Logic Nets. IEEETC, Vol. C-21, 1972.
Roth, J. P.: Diagnosis of Automata Failures: A Calculus and a Method. IBM Journal, Vol. 10, No. 7, 1967.
Szygenda, S. A.; Thompson, E. W.: Modelling and Digital Simulation for Design Verifi-cation and Diagnosis. IEEETC, Vol. C-25, 1976.
Armstrong, D. B.: A Deductive Method for Simulating Faults in Logic Circuits, IEEETC, Vol. C-21, 1972.
Abramovici, M.; Breuer, M. A.; Kumar, K.: Concurrent Fault Simulation of Digital Circuits Described with Gate and Functional Models. Proc. STL,1979.
Fazekas, P.; Feuerbaum, H.-P.; Wolfgang, E.: Scanning Electron Beam Probes VLSI Chips. Electronics, July 14, 1981.
Coshwait, D. L.; Ivey, F. W.: Voltage Contrast, Methods for Semiconductor Device Failure Analysis. SEM, 1974, pp. 935–940.
Short Description SITEST 764: The Computer Controlled Tester for LSI/VLSI Chips. Siemens, München.
Daehn, W.: Deterministische Testmustergenerierung für den eingegebenen Selbsttest von integrierten Schaltungen. NTG Fachberichte Nr. 82/1983, pp. 16–19.
Zuxi Sun, Laung-Terng Wang: Self-Testing of Embedded RAMs. Int. Test Conf. 1984, pp. 148–156.
Frohwerk, R. A.: Signature Analysis: A New Digital Field Service Method. Hewlett Packard Journal, May 1977, pp. 2–8.
Bhavshar, D. K.; Krishnamurthy, B.: Can We Eliminate Fault Escape in Self Testing by Polynamical Division (Signature Analysis). Int. Test Conf. 1984, pp. 134–139.
Koenemann, B.; Mucha, J.; Zwiehoff, G.: Built-in Logic Block-Observation Technique. Digest Int. Test Conf. 1979, pp. 37–41.
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© 1987 Springer-Verlag Heidelberg
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Hörbst, E., Müller-Schloer, C., Schwärtzel, H. (1987). Test Concepts. In: Design of VLSI Circuits. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-95525-9_4
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DOI: https://doi.org/10.1007/978-3-642-95525-9_4
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