Abstract
The main results achieved in the HTS Josephson junction technology are reviewed and the possible reasons leading to the reduction of their characteristic voltage are discussed. It is emphasized that the electron diffraction at the SN boundaries as well as at the inliomogeneities in CuO planes plays a decisive role in HTS weak links and grain boundary junctions.
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© 1992 Springer-Verlag Berlin Heidelberg
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Kupriyanov, M.Y. (1992). Physics of Josephson Junctions Made of High-T c Superconductors. In: Koch, H., Lübbig, H. (eds) Superconducting Devices and Their Applications. Springer Proceedings in Physics, vol 64. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-77457-7_2
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DOI: https://doi.org/10.1007/978-3-642-77457-7_2
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