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Percolation and Josephson Effects in High-T c Polycrystalline Thin Films

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Superconducting Devices and Their Applications

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 64))

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Abstract

The electrical properties and Josephson behaviour of high-Tc polycrystalline thin films are shown to be consistent with the model of a 2D array of intergrain Josephson junctions with an exponentially wide distribution of parameters. In these films the electrical currents flow through the critical subnetwork, with characteristic percolation length L being much larger than the grain size a. Single-Josephson-junction behavior is realized in polyciystalline high-Tc bridges with the dimensions w,l in the limits ξ< < a < w,l < L, and high responsive radiation detectors and Squid’s based on these bridges are demonstrated.

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Author information

Authors and Affiliations

  1. Institute of Radioengineering & Electronics of the Academy of Sciences, Marx Avenue 18, 103907, Moscow, Russia

    Yu. Ya. Divin & V. N. Gubankov

Authors
  1. Yu. Ya. Divin
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  2. V. N. Gubankov
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Editor information

Editors and Affiliations

  1. Institut Berlin, Physikalisch-Technische Bundesanstalt, Abbestraße 2-12, W-1000, Berlin 10, Fed. Rep. of Germany

    Hans Koch  & Heinz Lübbig  & 

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© 1992 Springer-Verlag Berlin Heidelberg

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Divin, Y.Y., Gubankov, V.N. (1992). Percolation and Josephson Effects in High-T c Polycrystalline Thin Films. In: Koch, H., Lübbig, H. (eds) Superconducting Devices and Their Applications. Springer Proceedings in Physics, vol 64. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-77457-7_10

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  • DOI: https://doi.org/10.1007/978-3-642-77457-7_10

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-77459-1

  • Online ISBN: 978-3-642-77457-7

  • eBook Packages: Springer Book Archive

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