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Studying Surface Chemistry Atom-by-Atom Using the Scanning Tunneling Microscope

  • Chapter
Chemistry and Physics of Solid Surfaces VIII

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 22))

Abstract

A solid surface provides a great variety of sites for a possible chemical reaction. A perfect surface may have several strucutrally inequivalent sites while a real life surface may have steps, a multitude of point and extended defect sites, adsorbed foreign atoms, etc. It is clear then that in order to even begin discussing the chemistry of a particular surface we have to have a good idea about its structure. This recognized need has led to the development of a great variety of surface structural techniques [16.1]. Most of these techniques provide information averaged over a macroscopic area of the sample defined by the size of the probe beam. Moreover, diffraction-based structural probes require long-range order which is not present in many cases of interest. Even when the structure of the surface is known, the understanding of the reactivities of the various sites requires that a correlation be made between the chemical behavior of a particular site and its local electronic structure. Thus, ideally one needs a surface technique or techniques which will allow the study of the topography and valence electronic structure of surfaces with atomic resolution.

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Author information

Authors and Affiliations

  1. IBM Research Division, T.J. Watson Research Center, Yorktown Heights, NY, 10598, USA

    Phaedon Avouris & In-Whan Lyo

Authors
  1. Phaedon Avouris
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  2. In-Whan Lyo
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Editor information

Editors and Affiliations

  1. Department of Chemistry and Laboratory for Surface Studies, The University of Wisconsin-Milwaukee, 53201, Milwaukee, WI, USA

    Ralf Vanselow Ph.D.

  2. Department of Chemistry, Private Bag, University of Auckland, Auckland, New Zealand

    Russell Howe

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© 1990 Springer-Verlag Berlin Heidelberg

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Avouris, P., Lyo, IW. (1990). Studying Surface Chemistry Atom-by-Atom Using the Scanning Tunneling Microscope. In: Vanselow, R., Howe, R. (eds) Chemistry and Physics of Solid Surfaces VIII. Springer Series in Surface Sciences, vol 22. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-75762-4_16

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  • DOI: https://doi.org/10.1007/978-3-642-75762-4_16

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-75764-8

  • Online ISBN: 978-3-642-75762-4

  • eBook Packages: Springer Book Archive

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