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Theoretical Aspects of Scanning Tunneling Microscopy

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Chemistry and Physics of Solid Surfaces VIII

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 22))

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Abstract

Since its invention by Binnig, Rohrer, and coworkers [14.1], scanning tunneling microscopy (STM) has established itself as a remarkable tool for studying surfaces. This chapter reviews the present theoretical understanding of STM, with emphasis on the interpretation of atomic-resolution STM images. The basic ideas and instrumentation have already been described in detail elsewhere [14.1].

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Author information

Authors and Affiliations

  1. IBM Research Division, T.J. Watson Research Center, Yorktown Heights, NY 10598, USA

    J. Tersoff

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  1. J. Tersoff
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Editor information

Editors and Affiliations

  1. Department of Chemistry and Laboratory for Surface Studies, The University of Wisconsin-Milwaukee, 53201, Milwaukee, WI, USA

    Ralf Vanselow Ph.D.

  2. Department of Chemistry, Private Bag, University of Auckland, Auckland, New Zealand

    Russell Howe

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© 1990 Springer-Verlag Berlin Heidelberg

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Tersoff, J. (1990). Theoretical Aspects of Scanning Tunneling Microscopy. In: Vanselow, R., Howe, R. (eds) Chemistry and Physics of Solid Surfaces VIII. Springer Series in Surface Sciences, vol 22. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-75762-4_14

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  • DOI: https://doi.org/10.1007/978-3-642-75762-4_14

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-75764-8

  • Online ISBN: 978-3-642-75762-4

  • eBook Packages: Springer Book Archive

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