Abstract
When a beam of electrons with energies greater than several hundred eV is incident upon a ferromagnetic metal, spin polarized secondary electrons are emitted. The polarization of these secondary electrons is related to the polarization of the electrons in the ferromagnet. In the case of transition metal ferromagnets, the polarization of the secondary electrons is directly proportional to the magnetization. Spin polarization analysis of the secondary electrons, therefore, provides a direct measurement of the magnetization in the region probed by the incident electron beam. Scanning electron microscopy with polarization analysis (SEMPA), illustrated schematically in Fig. 11.1, combines the finely focused beam of the scanning electron microscope with secondary electron spin polarization analysis to obtain a technique that provides high resolution images of the surface magnetic microstructure of ferromagnetic materials. The purpose of this chapter is to review the SEMPA technique and to present several examples of magnetic microstructures that were studied using SEMPA.
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References
J. Kessler: Polarized Electrons, 2nd Ed. (Springer, Berlin, Heidelberg 1985)
R. Feder: Polarized Electrons in Surface Physics (World Scientific, Singapore 1985)
R.J. Celotta, D.T. Pierce: Science 234, 333 (1986)
J. Kirschner: Polarized Electrons at Surfaces (Springer, Berlin, Heidelberg 1985)
T.H. DiStefano: IBM Tech. Disci. Bull. 20, 4212 (1978)
J. Unguris, D.T. Pierce, A. Galejs, RJ. Celotta: Phys. Rev. Lett. 49, 72 (1982)
J. Kirschner: Scanning Electron Microsc. 1984; III: 1179 (1984)
K. Koike, K. Hayakawa: Jpn. J. Appi. Phys. 23, L187 (1984)
J. Unguris, G.G. Hembree, R.J. Celotta, D.T. Pierce: J. Mircroscopy 139, RP1 (1985)
K. Koike, H. Matsuyama, K. Hayakawa: Scanning Micro. Intern., Supp. 1 241 (1987)
G.G. Hembree, J. Unguris, RJ. Celotta, D.T. Pierce: Scanning Micro. Intern., Supp. 1, 229 (1987)
D.T. Pierce, J. Unguris, RJ. Celotta: MRS Bulletin 13(6), p. 19 (1988)
H.S. Williams, R.M. Bozorth, W. Shockley: Phys. Rev. 75, p. 155 (1949)
W. Rave, R. Schäfer, A. Hubert: J. Magn. Magnet. Mat. 65(7) (1987)
B.E. Argyle, B. Petek, D.A. Herman, Jr.: J. Appi. Phys. 61, 4303 (1987)
D.E. Newbury, D.C. Joy, P. Echlin, C.E. Fiori, J.I. Goldstein: (Plenum New York, 1986) p. 147
J.P. Jakubovics: Electron Microscopy in Materials Science Part IV, ed. by E. Ruedl, U. Valdre (Commission of the European Communities, Brussels, 1973) p. 1305
J.N. Chapman, S. McVitie, J.R. McFadyen: Scanning Electron Microscopy Suppl. 1, 221 (1987)
A. Tonomura: J. Appi. Phys. 61, 4297 (1987)
Y. Martin, D. Rugar, H.K. Wickramasinghe: Appi. Phys. Lett. 52, 244 (1988)
J. Kirschner: In Surface and Interface Characterization by Electron Optical Methods, ed. by A. Howie, U. Valdre, (Plenum, New York, 1987) p. 267
E. Kisker, W. Gudat, K. Schröder: Solid State Commun. 44, 591 (1982)
H. Hopster, R. Raue, E. Kisker, G. Guntherodt, M. Campagna: Phys. Rev. Lett. 50,70 (1983)
D. Penn, S.P. Apell, S.M. Girvin: Phys. Rev. Lett. 55(5), 518 (1985)
D.R. Penn, S.P. Apell, S.M. Girvin: Phys. Rev. B 32(12), 7753 (1985)
J. Kirschner, D. Rebenstorff, H. Ibach: Phys. Rev. Lett. 53, 694 (1984)
J. Glazer, E. Tosatti: Solid State Commun. 52, 905 (1984)
H. Hopster, R. Raue, R. Clauberg: Phys. Rev. Lett. 53, 695 (1984)
H. Seiler: J. Appi. Phys. 54, R1 (1983)
M.P. Seah, W.A. Dench: Surf. Interface Anal. 1, 2 (1979)
D.L. Abraham, H. Hopster: Phys. Rev. Lett. 58, 1352 (1987)
M.R. Scheinfein, J. Unguris, M.H. Kelley, D.T. Pierce, R.J. Celotta: Rev. Sei. Inst, (to be published)
H.P. Oepen, J. Kirschner: Phys. Rev. Lett. 62(7), 819 (1989)
J. Orioff: Ultramicr. 28, 88 (1989)
K. Koike, H. Matsuyama, H. Todokoro, K. Hayakawa: Scanning Micr. 1(1), 31 (1987)
M.R. Scheinfein: Optik 82(3), 99 (1989)
E. Kisker, R. Clauberg, W. Gudat: Rev. Sci. Instr. 53, 1137 (1982)
L.G. Gray, M.W. Hart, F.B. Dunning, G.K. Walters: Rev. Sci. Instr. 55(1), 88 (1984)
J. Unguris, D.T. Pierce, R.J. Celotta: Rev. Sci. Instr. 57(7), 1314 (1986)
M.R. Scheinfein, D.T. Pierce, J. Unguris, J J. McClelland, R.J. Celotta: Rev. Sci. Instr. 60(1), 1 (1989)
D.T. Pierce, S.M. Girvin, J. Unguris, R.J. Celotta: Rev. Sci. Instr. 52(10), 1437 (1981)
K. Koike, H. Matsuyama, K. Hayakawa: Jap. J. Appi. Phys. 27(7), L1352 (1988)
D.T. Pierce, R.J. Celotta, M.H. Kelley, J. Unguris: Nuc. Inst. Meth. A266, 550 (1988)
K. Koike, K. Hayakawa: J. Appi. Phys. 57(1), 4244 (1985)
J.A. Venables, A.P. Janssen: Proc. of the 9th Int. Conf. on Electron Microscopy, Toronto (1978)
M.H. Kelley, J. Unguris, M.R. Scheinfein, D.T. Pierce, R J. Celotta: Proc. of the Microbeam Analysis Society — 1989, ed. by P.E. Russell, (San Francisco Press, San Francisco 1989) p. 391
T. VanZandt, R. Browning, C.R. Helms, H. Poppa, M. Landolt: to be published in Rev. Sci. Inst.
K. Koike, H. Matsuyama, H. Todokoro, K. Hayakawa: Jap. J. Appi. Phys. 24(8), 1978 (1985)
K. Koike, H. Matsuyama, H. Todokoro, K. Hayakawa: Jap. J. Appi. Phys. 24(10), L833 (1985)
H. Matsuyama, K. Koike, H. Todokoro, K. Hayakawa, IEEE Translation Journal on Magnetics in Japan, TJMJ-1(9), 1071 (1985)
K. Hayakawa, K. Koike, H. Matsuyama: Hitachi Inst. News 14, 11 (1988)
G.G. Hembree, J. Unguris, RJ. Celotta, D.T. Pierce: Proc. of the 44th EMS A Meeting, ed. by G.W. Bailey, (San Francisco Press, San Francisco, 1986) p. 634
J. Unguris, G.G. Hembree, R J. Celotta, D.T. Pierce: J. Vac. Sci. Technol. A5(4), 1976 (1987)
J. Unguris, M.R. Scheinfein, D.T. Pierce, RJ. Celotta: Appl. Phys. Lett. 55(24), 2553 (1989)
H. Kronmuller, W. Ferengel: Phys. Stat. Sol. (a) 64, 593 (1981)
JD. Livingston: J. Appl. Phys. 57, 3555 (1985)
V. Lakshmanan, J.C.M. Li: Proc. of the Sixth Int. Conf. on Rapidly Quenched Metals, Mat. Sei. Eng. 98, 483 (1988)
B.D. Cullity: Introduction to Magnetic Materials, (Addison-Wesley, Reading, MA 1972) p. 429
A. Hubert: Phys. Status Solidi B 32, 519 (1969)
A.E. LaBonte: J. Appl. Phys. 40, 2450 (1969)
F. Schmidt, W. Rave, A. Hubert: IEEE Trans. Mag. 21, 1596 (1985)
M.R. Scheinfein, J. Unguris, RJ. Celotta, D.T. Pierce: Phys. Rev. Lett. 63, 668 (1989)
11.63M. R. Scheinfein, J. Unguris, D. T. Pierce, R. J. Celotta: Proc. of 34th Conf. on Magnetism and Magnetic Materials, Boston, MA.
M.R. Scheinfein, J. Unguris, P. Ryan, R.J. Celotta, D.T. Pierce: unpublished
M.R. Scheinfein, J. Unguris, RJ. Celotta, D.T. Pierce: International Workshop on the Magnetic Properties of Low Dimensional Systems, San Luis Potosi, Mexico, ed. by L.M. Falicov, J.L. Moran-Lopez, (Springer, Berlin, Heidelberg, November 1989)
A. Hubert: J. de Phys. Coll. C8, 49, 1865 (1988)
R. Schafer, W.K. Ho, J. Yamasaki, A. Hubert, F.B. Humphrey: Proc. of Intermag 1989, Washington, DC, to be published in IEEE Trans. Magn.
D.T. Pierce, M.R. Scheinfein, J. Unguris, R J. Celotta: Materials Research Society Symposium Proceedings 151, 49 (1989)
M. Hartmann, B.AJ. Jacobs, J.J.M. Braat: Phillips Techn. Review 42, 37 (1985)
M. Aeschlimann, M.R. Scheinfein: private communication
J.L. Robins, R.J. Celotta, J. Unguris, D.T. Pierce, B.T. Jonker, G.A. Prinz: Appl. Phys. Lett. 52 (22), (1988)
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Unguris, J., Scheinfein, M.R., Celotta, R.J., Pierce, D.T. (1990). Scanning Electron Microscopy with Polarization Analysis: Studies of Magnetic Microstructure. In: Vanselow, R., Howe, R. (eds) Chemistry and Physics of Solid Surfaces VIII. Springer Series in Surface Sciences, vol 22. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-75762-4_11
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DOI: https://doi.org/10.1007/978-3-642-75762-4_11
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