Abstract
Radiation damage, i.e. the introduction of structural (e.g. loss of crystallinity) or compositional (e.g. mass loss) changes by the electron beam, has been an inevitable and serious factor in limiting the amount of microstructural information that can be collected from an electron microscope specimen. Although radiation damage is always present because it is part of the electron beam/specimen interaction that produces the image, it may be reduced or minimized, if it and the physical factors that affect it are well understood.
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© 1987 Springer-Verlag Berlin Heidelberg
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Talmon, Y. (1987). Electron Beam Radiation Damage to Organic and Biological Cryospecimens. In: Steinbrecht, R.A., Zierold, K. (eds) Cryotechniques in Biological Electron Microscopy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-72815-0_3
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DOI: https://doi.org/10.1007/978-3-642-72815-0_3
Publisher Name: Springer, Berlin, Heidelberg
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