Abstract
The advantages of using a configured detector to obtain differential phase contrast image in a scanning transmission X-ray microscope are described. A prototype system using a CCD detector has been installed on the microscopy beamline at BESSY, and the first images have been acquired.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Rudolph, D., Schmahl, G., Niemann, B.: Amplitude and phase contrast in X-ray microscopy. In: Duke, P.J., Michette, A.G. (eds.): Modern Microscopies. Plenum, New York 1990 pp.59–67
Schmahl, G., Rudolph, D., Schneider, G., Guttmann, P., Niemann, B.: Phase contrast X-ray microscopy studies. Optik 97 (1994) 181–182
McNulty, I.: The future of X-ray holography. Nucl. Inst. Meth. Phys. Res. A 347 (1994) 170-176
Snigirev, A., Snigireva, I., Kohn, V., Kuznetsov, A., Schelokov, I.: On the possibilities of X-ray phase-contrast microimaging by coherent high-energy synchrotron radiation. Rev. Sci. Instrum. 66 (1995) 5486–5492
Zeitler, E., Thomson, M.G.R: Scanning transmission electron microscopy I and II. Optik 31 (1970) 258–280, and 359–366
Morrison, G.R: X-ray imaging with a configured detector. In: Aristov, V.V., Erko, A.I. (eds.): X-ray Microscopy IV. Bogorodski Pechatnik, Chernogolovka 1994 pp.479–484
Waddell, E.M., Chapman, J.N.: Linear imaging of strong phase objects using asymmetrical detectors in STEM. Optik 54 (1979) 83–96
Dekkers N.H.de, Lang, H.: Differential phase contrast in a STEM. Optik 41 (1974) 452–456
Morrison, G.R, Browne, M.T.: Darkfield imaging with the scanning transmission X-ray microscope. Rev. Sci. Instrum. 63 (1992) 611–614
Chapman, H.N., Jacobsen, C.J., Williams, S.: A characterisation of dark-field imaging of colloidal gold labels in a scanning transmission X-ray microscope. Ultramicroscopy 62 (1996) 191–213
Palmer, J.R, Morrison, G.R: The use of avalanche photodiodes for the detection of soft X-rays. Rev. Sci. Instrum. 63 (1992) 828–831
Browne, M.T., Morrison, G.R: A 100ns anti-coincidence circuit for multi-channel counting systems. Measurement Science and Technology 6 (1995) 1487–1491
Wilhein, T., Rothweiler, D., Tusche, A., Scholze, F., Meyer-Ilse, W.: Thinned, back-illuminated CCDs for X-ray microscopy. In: Aristov, V.V., Erko, A.I. (eds.): X-ray Microscopy IV. Bogorodski Pechatnik, Chernogolovka 1994 pp.47D-474
Chapman, H.N.: Phase-retrieval X-ray microscopy by Wigner distribution deconvolution. Ultramicroscopy 66 (1996) 153–172
Rodenburg, J.M., Bates, RH.T.: The theory of super-resolution electron microscopy via Wigner-distribution deconvolution. Phil. Trans. R Soc. Lond. A 339 (1992) 521–553
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1998 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Morrison, G.R., Niemann, B. (1998). Differential Phase Contrast X-Ray Microscopy. In: Thieme, J., Schmahl, G., Rudolph, D., Umbach, E. (eds) X-Ray Microscopy and Spectromicroscopy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-72106-9_10
Download citation
DOI: https://doi.org/10.1007/978-3-642-72106-9_10
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-72108-3
Online ISBN: 978-3-642-72106-9
eBook Packages: Springer Book Archive