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Characterization of TEGFETs and MESFETs Using the Electrooptic Sampling Technique

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Picosecond Electronics and Optoelectronics

Part of the book series: Springer Series in Electrophysics ((SSEP,volume 21))

Abstract

Recent advances in GaAs technology have resulted in several new classes of devices, all of which have very high speed response [1,2]. These devices have been shown, indirectly, to have response times of tens of picoseconds [1]. Indirect measurements are necessary because available sampling oscilloscopes have a limiting response of 25 picoseconds and jitter of a few picoseconds. Hence, most ultrafast devices are characterized in a ring oscillator configuration of several devices and individual device response is averaged. In the frequency domain most RF measurements are connector limited to the range of 18 GHz.

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References

  1. H. Morkoc and P. M. Solomon: IEEE Spectrum 21, No. 2, 28 (1984).

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Author information

Authors and Affiliations

  1. Laboratory for Laser Energetics, Univesity of Rochester, 250 East River Road, Rochester, NY, 14623, USA

    K. E. Meyer, D. R. Dykaar & G. A. Mourou

Authors
  1. K. E. Meyer
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  2. D. R. Dykaar
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  3. G. A. Mourou
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Editor information

Editors and Affiliations

  1. Department of Physics, The University of Rochester, Rochester, NY, 14627, USA

    Gerard Albert Mourou

  2. Edward L. Ginzton Laboratory, Stanford University, Stanford, CA, 94305, USA

    David M. Bloom

  3. Department of Electrical Engineering, University of Maryland, College Park, MD, 20742, USA

    Chi-H. Lee

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© 1985 Springer-Verlag Berlin Heidelberg

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Meyer, K.E., Dykaar, D.R., Mourou, G.A. (1985). Characterization of TEGFETs and MESFETs Using the Electrooptic Sampling Technique. In: Mourou, G.A., Bloom, D.M., Lee, CH. (eds) Picosecond Electronics and Optoelectronics. Springer Series in Electrophysics, vol 21. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-70780-3_9

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  • DOI: https://doi.org/10.1007/978-3-642-70780-3_9

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-70782-7

  • Online ISBN: 978-3-642-70780-3

  • eBook Packages: Springer Book Archive

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