Abstract
The application of femtosecond optics to the measurement and characterization of the electronic properties of materials and devices is reviewed with emphasis on new approaches to the generation and detection of extremely fast electromagnetic transients. Specific topics discussed are: (i) the use of the inverse electro-optic effect for electrical pulse generation, (ii) the intrinsic speed of response of electro-optic materials, and (iii) a new approach to far-infrared spectroscopy which uses time-domain measurements of single-cycle pulses.
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REFERENCES
For a review, the reader is referred to the articles in this volume and to the book, Picosecond Optoelectronic Devices, ed. C. H. Lee, Academic Press (1984).
D. H. Auston, K. P. Cheung, J. A. Valdmanis, and D. A. Kleinman, Phys. Rev. Lett., 53, 1555 (1984).
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J. A. Valdmanis, R. L. Fork, and J. P. Gordon, Opt. Lett., 10, 11 (1985).
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D. H. Auston and K. P. Cheung, to be published in J. Opt. Soc. Am., B, April (1985).
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© 1985 Springer-Verlag Berlin Heidelberg
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Auston, D.H., Cheung, K.P., Valdmanis, J.A., Smith, P.R. (1985). Ultrafast Optical Electronics: From Femtoseconds to Terahertz. In: Mourou, G.A., Bloom, D.M., Lee, CH. (eds) Picosecond Electronics and Optoelectronics. Springer Series in Electrophysics, vol 21. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-70780-3_1
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DOI: https://doi.org/10.1007/978-3-642-70780-3_1
Publisher Name: Springer, Berlin, Heidelberg
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