Abstract
Until recently mineralogists have been mainly accustomed to two classical tools i.e. the polarizing microscope and X-ray diffraction techniques. With the optical microscope we are able to determine the morphology and optical properties; we can see twins and exsolution lamellae which are larger than the wavelength of light. From X-ray diffraction data we can derive accurately the position of atoms in the unit cell on the scale between 1 and 100Å. However such a crystal structure determination gives us an average over many thousands of unit cells, and assumes that all cells are identical.
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Wenk, HR. (1976). Introduction. In: Wenk, HR. (eds) Electron Microscopy in Mineralogy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-66196-9_1
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DOI: https://doi.org/10.1007/978-3-642-66196-9_1
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