Abstract
Atomic force microscopy [1] (AFM) is a powerful tool to image and characterize the topography of a surface. In contrast to optical imaging methods, the atomic force microscope is not limited by the diffraction limit and imaging with sub-nanometer resolution is feasible. Additionally, the atomic force microscope provides images with exact dimensions as the contrast purely results from height differences of the sample
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Vogel, N. (2012). Characterization Methods. In: Surface Patterning with Colloidal Monolayers. Springer Theses. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-35133-4_4
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DOI: https://doi.org/10.1007/978-3-642-35133-4_4
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