Abstract
Automated test generation is gaining popularity in the software industry, largely due to its labor-saving benefits and its ability to achieve high test coverage. The introduction of this technology into an organization does not, however, always meet with success. One reason for this is often the fact that the testing process and organization are not adjusted accordingly. Thus, in order for an organization to successfully pursue automated test generation, the test process must also be improved to enable this development. In this paper, we introduce an automated test generation add-on for the popular test process improvement model, TPI. We also present a baseline TPI profile for successful introduction of automated test generation.
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References
TPI Automotive. Tech. rep., Sogeti Deutschland GmbH, version 1.01 (2004), http://www.tpiautomotive.de/produkte.html (cited May 2011)
Bach, J.: Exploratory testing explained (April 2003), http://www.satisfice.com/articles/et-article.pdf (cited May 2011)
Broekman, B., Koomen, T., van der Aalst, L., Vroon, M.: TMap Next for result-driven testing. UTN Publishers (2006)
Burnstein, I.: Practical Software Testing. Springer-Verlag New York, Inc. (2003)
Hartman, A., Katara, M., Olvovsky, S.: Choosing a Test Modeling Language: A Survey. In: Bin, E., Ziv, A., Ur, S. (eds.) HVC 2006. LNCS, vol. 4383, pp. 204–218. Springer, Heidelberg (2007)
Heiskanen, H., Maunumaa, M., Katara, M.: Test process improvement for automated test generation (April 2010), http://practise.cs.tut.fi/files/publications/AMOEBA/reports/Atg-tpi_report.pdf
Jääskeläinen, A., Katara, M., Kervinen, A., Maunumaa, M., Pääkkönen, T., Takala, T., Virtanen, H.: Automatic GUI test generation for smart phone applications – an evaluation. In: Proc. of the Software Engineering in Practice track of ICSE 2009, companion volume, pp. 112–122. IEEE CS (2009)
Jääskeläinen, A., Kervinen, A., Katara, M.: Creating a test model library for GUI testing of smartphone applications. In: Proc. QSIQ 2008 (short paper), pp. 276–282. IEEE CS (2008)
Jung, E.: A test process improvement model for embedded software developments. In: Proc. QSIC 2009, pp. 432–437. IEEE CS (2009)
Koomen, T., Pol, M.: Test Process Improvement: A practical step-by-step guide to structured testing. Addison–Wesley (1999)
Malik, Q.A., Jääskeläinen, A., Virtanen, H., Katara, M., Abbors, F., Truscan, D., Lilius, J.: Model-based testing using system vs. test models – what is the difference? In: Proc. ECBS 2010 (poster session), pp. 291–299. IEEE CS (2010)
Newman, N.: Using monkey test tools. Software Testing and Quality Engineering 2(1), 18–21 (2001)
Pol, M., Teunissen, R., van Veenendaal, E.: Software Testing: A guide to the TMap Approach. Addison–Wesley Professional (2001)
Rushby, J.: Automated Test Generation and Verified Software. In: Meyer, B., Woodcock, J. (eds.) VSTTE 2005. LNCS, vol. 4171, pp. 161–172. Springer, Heidelberg (2008)
Sogeti: TPI Next – Business Driven Test Process Improvement. UTN Publishers (2009)
TMMi Foundation homepage, www.tmmifoundation.org/ (cited May 2011)
Utting, M., Legeard, B.: Practical Model-Based Testing – A Tools Approach. Morgan Kaufmann (2007)
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Heiskanen, H., Maunumaa, M., Katara, M. (2012). A Test Process Improvement Model for Automated Test Generation. In: Dieste, O., Jedlitschka, A., Juristo, N. (eds) Product-Focused Software Process Improvement. PROFES 2012. Lecture Notes in Computer Science, vol 7343. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-31063-8_3
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DOI: https://doi.org/10.1007/978-3-642-31063-8_3
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