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Qualitative Analysis (Principle and Spectral Interpretation)

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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 49))

Abstract

Electron spectroscopy is based on the element-specific binding energy of electrons in the atomic shell and their determination by electron spectrometers.

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References

  1. J.F. Watts, J. Wolstenholme, An Introduction to Surface Analysis by XPS and AES (Wiley, Chichester, 2003)

    Book  Google Scholar 

  2. M. Thompson, M.D. Baker, A. Christie, J.F. Tyson, Auger Electron Spectroscopy (Wiley, New York, 1985)

    Google Scholar 

  3. D. Briggs, J.C. Rivière, Spectral Interpretation, in Practical Surface Analysis Vol. 1 (AES and XPS), 2nd edn., ed. by D. Briggs, M.P. Seah (Wiley, Chichester, 1990), pp. 85–141

    Google Scholar 

  4. M.P. Seah, I.S. Gilmore, S.J. Spencer, Surf. Interface Anal. 26, 617 (1998)

    Article  Google Scholar 

  5. M.P. Seah, Instrument Calibration for AES and XPS, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 167–189

    Google Scholar 

  6. J.F. Moulder, W.F. Stickle, P.E. Sobol, K.D. Bomben, Handbook of X-Ray Photoelectron Spectroscopy (Perkin–Elmer Corp., Physical Electronics Division, Eden Prairie, 1992)

    Google Scholar 

  7. N. Ikeo, Y. Iijima, N. Niimura, M. Sigematsu, T. Tazawa, S. Matsumoto, K. Kojima, Y. Nagasawa, Handbook of X-ray Photoelectron Spectroscopy (JEOL, Akishima, 1991)

    Google Scholar 

  8. T. Sekine, Y. Nagasawa, M. Kudo, Y. Sakai, A.S. Parker, J.D. Geller, A. Mogami, K. Hirata, Handbook of Auger Electron Spectroscopy (JEOL, Tokyo, 1982)

    Google Scholar 

  9. K.D. Childs, B.A. Carlson, L.A. LaVanier, J.F. Moulder, D.F. Paul, W.F. Stickle, D.G. Watson, Handbook of Auger Electron Spectroscopy, 3rd edn. (Physical Electronics Inc., Eden Prairie, 1995)

    Google Scholar 

  10. C.D. Wagner, A.V. Naumkin, A. Kraut-Vass, J.W. Allison, C.J. Powell, J.R. Rumble, NIST X-Ray Photoelectron Spectroscopy Database, SRD 20, Version 3.5 (National Institute of Standards and Technology, Gaithersburg, 2008), http://srdata.nist.gov/xps/

  11. Common Data Processing System (COMPRO). www.sasj.gr.jp/COMPRO/index.html

  12. J.T. Grant, Databases, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 869–873

    Google Scholar 

  13. S. Hüfner, Unfilled InnerShells: Transition Metals and Compounds, in Photoemission in Solids II, ed. by L. Ley, M. Cardona (Springer, Berlin-Heidelberg-New York, 1979), pp. 173–216

    Chapter  Google Scholar 

  14. S. Hüfner, Photoelectron Spectroscopy, 3rd edn. (Springer, Berlin, 2003)

    Google Scholar 

  15. A. Rosencwaig, G.K. Wertheim, J. Electron Spectrosc. Relat. Phenom. 1, 493 (1973)

    Article  Google Scholar 

  16. K. Siegbahn, C.N. Nordling, A. Fahlman, R. Nordberg, K. Hamrin, J. Hedman, G. Johansson, T. Bermark, S.E. Karlsson, ESCA: Atomic, Molecular and Solid State Structure Studied by Means of Electron Spectroscopy (Almqvist and Wiksells, Uppsala, 1967)

    Google Scholar 

  17. U. Gelius, Phys. Scr. 9, 133 (1974)

    Article  ADS  Google Scholar 

  18. L. Kövér, Chemical Effects in XPS, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 421–464

    Google Scholar 

  19. L.P.H. Jeurgens, F. Reichel, S. Frank, G. Richter, E.J. Mittemeijer, Surf. Interface Anal. 40, 259 (2008)

    Article  Google Scholar 

  20. S. Hofmann, J.M. Sanz, Fres. Z. Anal. Chem. 314, 215 (1983)

    Article  Google Scholar 

  21. C.D. Wagner, Anal. Chem. 44, 967 (1972)

    Article  Google Scholar 

  22. S.W. Gaarenstrom, N. Winograd, J. Chem. Phys. 67, 3500 (1977)

    Article  ADS  Google Scholar 

  23. C.D. Wagner, A. Joshi, J. Electron Spectrosc. Relat. Phenom. 47, 283 (1988)

    Article  Google Scholar 

  24. G. Moretti, J. Electron Spectrosc. Relat. Phenom. 95, 95 (1998)

    Article  Google Scholar 

  25. R.H. West, J.E. Castle, Surf. Interface Anal. 4, 86 (1982)

    Article  Google Scholar 

  26. G. Moretti, Surf. Interface Anal. 17, 352 (1991)

    Article  Google Scholar 

  27. T.D. Thomas, J. Electron Spectrosc. Relat. Phenom. 20, 117 (1980)

    Article  Google Scholar 

  28. J.C. Rivière, J.A.A. Crossley, G. Moretti, Surf. Interface Anal. 14, 257 (1989)

    Article  Google Scholar 

  29. I.leR. Strydom, S. Hofmann, Vacuum 41, 1619 (1990)

    Google Scholar 

  30. M.-L. Abel, P. Tsakiropoulos, J.F. Watts, J.A.D. Matthew, Surf. Interface Anal. 34, 775 (2002)

    Article  Google Scholar 

  31. L.P.H. Jeurgens, W.G. Sloof, C.G. Borsboom, F.D. Tichelaar, E.J. Mittemeijer, Appl. Surf. Sci. 161, 139 (2000)

    Article  ADS  Google Scholar 

  32. L.P.H. Jeurgens, W.G. Sloof, C.G. Borsboom, F.D. Tichelaar, E.J. Mittemeijer, Appl. Surf. Sci. 144–145, 11 (1999)

    Article  Google Scholar 

  33. W. Pamler, Surf. Interface Anal. 13, 55 (1988)

    Article  Google Scholar 

  34. D. Briggs, V.A. Gibson, Chem. Phys. Lett. 25, 493 (1974)

    Article  ADS  Google Scholar 

  35. G.K. Wertheim, Phys. Rev. B 25, 1987 (1982)

    Article  ADS  Google Scholar 

  36. P.M.A. Sherwood, Data Analysis in XPS and AES, in Practical Surface Analysis Vol. 1 (AES and XPS), 2nd edn., ed. by D. Briggs, M.P. Seah (Wiley, Chichester, 1990), pp. 555–586

    Google Scholar 

  37. N. Fairley, XPS Lineshapes and Curve Fitting, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 421–464

    Google Scholar 

  38. S. Doniach, M. Sunjic, J. Phys. C 3, 285 (1970)

    Article  ADS  Google Scholar 

  39. G.K. Wertheim, P.H. Citrin, Fermi Surface Excitations in X-Ray Photoemission Line Shapes from Metals, in Photoemission in Solids I, ed. by M. Cardona, L. Ley (Springer, Berlin/Heidelberg, 1978), pp. 197–236

    Google Scholar 

  40. G.K. Wertheim, L.R. Walker, J. Phys. F. Metal Phys. 6, 2297 (1976)

    Article  ADS  Google Scholar 

  41. G.K. Wertheim, S. Huefner, J. Inorg. Nucl. Chem. 38, 1701 (1976)

    Article  Google Scholar 

  42. I. Olefjord, H.J. Mathieu, P. Marcus, Surf. Interface Anal. 15, 681 (1990)

    Article  Google Scholar 

  43. C.S. Fadley, Prog. Surf. Sci. 16, 275 (1984)

    Article  ADS  Google Scholar 

  44. C.S. Fadley, Nucl. Instrum. Methods Phys. Res. A 601, 8 (2009)

    Article  ADS  Google Scholar 

  45. G. Grenet, Y. Jugnet, S. Holmberg, H.C. Poon, Tran Minh Duc, Surf. Interface Anal. 34, 367 (2003)

    Google Scholar 

  46. Y. Nihei, Surf. Interface Anal. 35, 45 (2003)

    Article  Google Scholar 

  47. M. El Kazzi, G. Grenet, C. Merckling, G. Saint-Girons, C. Botella, O. Marty, G. Hollinger, Phys. Rev. B 79, 195312 (2009)

    Article  ADS  Google Scholar 

  48. P.J. Orders, S. Kono, C.S. Fadley, R. Trehan, J.T. Lloyd, Surf. Sci. 119, 371 (1982)

    Article  ADS  Google Scholar 

  49. I. Morawski, M. Nowicki, Phys. Rev. B 75, 155412 (2007)

    Article  ADS  Google Scholar 

  50. A. Chasse, L. Niebergall, Yu. Kucherenko, Surf. Sci. 501, 244 (2002)

    Article  ADS  Google Scholar 

  51. Y. Kisaka, A. Hashimoto, A. Suzuki, S. Miyasaka, M. Nojima, M. Owari, Y. Nihei, Surf. Interface Anal. 40, 1646 (2008)

    Article  Google Scholar 

  52. J. Osterwalder, Structural Effects in XPS and AES: Diffraction, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 557–585

    Google Scholar 

  53. S. Omori, Y. Nihei, E. Rotenberg, J.D. Denlinger, S.D. Kevan, B.P. Tonner, M.A. Van Hove, C.S. Fadley, Phys. Rev. Lett. 88(55), 504 (2002)

    Google Scholar 

  54. T. Matsushita, F. Zhun Guo, F. Matsui, Y. Kato, H. Daimon, Phys. Rev. 75, 085419 (2007)

    Article  Google Scholar 

  55. S.A. Chambers, Surf. Sci. Rep. 16, 261 (1992)

    Article  ADS  Google Scholar 

  56. L. Kubler, F. Lutz, J.L. Bischoff, D. Bolmont, Surf. Sci. 251/252, 305 (1991)

    Google Scholar 

  57. J.C. Vickerman (ed.), Surface Analysis (Wiley, Chichester, 1997)

    Google Scholar 

  58. J.M. Walls, Methods of Surface Analysis (Cambridge University Press, Cambridge, 1989)

    Google Scholar 

  59. S. Hofmann, Auger Electron Spectroscopy, in Wilson and Wilson’s Comprehensive Analytical Chemistry, vol. IX, ed. by G. Svehla (Elsevier, Amsterdam, 1979), pp. 89–172

    Google Scholar 

  60. D. Chattarji, The Theory of Auger Transitions (Academic, London, 1976)

    Google Scholar 

  61. M.F. Chung, L.H. Jenkins, Surf. Sci. 22, 479 (1970)

    Article  ADS  Google Scholar 

  62. J.A. Bearden, A.F. Burr, Rev. Mod. Phys. 39, 125 (1967)

    Article  ADS  Google Scholar 

  63. W.A. Coghlan, R.E. Clausing, USAEC Rep. ORNL-TM-3676 (U.S. Dept. of Commerce, Springfield, 1971)

    Google Scholar 

  64. D. Coster, R.L. Kronig, Physica 2, 13 (1935)

    Article  ADS  MATH  Google Scholar 

  65. J. Erlewein, Ph.D. thesis, University of Stuttgart, Stuttgart, 1977

    Google Scholar 

  66. H.E. Bishop, J.C. Riviere, Appl. Phys. Lett. 16, 21 (1970)

    Article  ADS  Google Scholar 

  67. J.P. Langeron, Surf. Interface Anal. 14, 381 (1989)

    Article  Google Scholar 

  68. G.C. Smith, M.P. Seah, Surf. Interface Anal. 16, 144 (1990)

    Article  Google Scholar 

  69. T. Sekine, N. Ikeo, Y. Nagasawa, Appl. Surf. Sci. 100/101, 30 (1996)

    Google Scholar 

  70. D.E. Ramaker, Crit. Rev. Solid State Mater. Sci. 17, 211 (1991)

    Article  ADS  Google Scholar 

  71. D.E. Ramaker, J. Electron Spectrosc. Relat. Phenom. 66, 269 (1994)

    Article  Google Scholar 

  72. D.E. Ramaker, Chemical Information from Auger Lineshapes, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 465–500

    Google Scholar 

  73. A.P. Dementjev, K.I. Maslakova, A.V. Naumkin, Appl. Surf. Sci. 245, 128 (2005)

    Article  ADS  Google Scholar 

  74. S. Hofmann, J. Steffen, Surf. Interface Anal. 14, 59 (1989)

    Article  Google Scholar 

  75. Z.-J. Ding, R. Shimizu, Electron Backscattering and Channeling, in Surface Analysis by Auger and Photoelectron Spectroscopy, ed. by D. Briggs, J.T. Grant (IM Publications, Chichester, 2003), pp. 587–618

    Google Scholar 

  76. M. Prutton, I.R. Barkshire, M.M. El Gomati, J.C. Greenwood, P.G. Kenny, H. Roberts, Surf. Interface Anal. 18, 295 (1992)

    Article  Google Scholar 

  77. D.J. Szostak, H. Thomas, Surf. Interface Anal. 1, 312 (1988)

    Article  Google Scholar 

  78. F. Yubero, S. Tougaard, E. Elizalde, J.M. Sanz, Surf. Interface Anal. 20, 719 (1993)

    Article  Google Scholar 

  79. G. Gergely, Surf. Interface Anal. 3, 201 (1981)

    Article  Google Scholar 

  80. F. Yubero, S. Tougaard, Phys. Rev. B 46, 2486 (1992)

    Article  ADS  Google Scholar 

  81. G.G. Fuentes, E. Elizalde, F. Yubero, J.M. Sanz, Surf. Interface Anal. 33, 230 (2002)

    Article  Google Scholar 

  82. B. Akamatsu, P. Henoc, F. Maurice, C. Le Gressus, K. Raouadi, T. Sekine, T. Sakai, Surf. Interface Anal. 15, 7 (1990)

    Article  Google Scholar 

  83. Y. Sakai, A. Mogami, J. Vac. Sci. Technol. A 5, 1222 (1987)

    Article  ADS  Google Scholar 

  84. D.G. Frank, A.T. Hubbard, Auger Microscopy, Angular Distribution, in Concise Encyclopedia of Materials Characterization, ed. by R.W. Cahn, E. Lifshin (Pergamon Press, Oxford, 1993), pp. 34–41

    Google Scholar 

  85. P. Lejček, A. Rar, S. Hofmann, Surf. Interface Anal. 34, 375 (2002)

    Article  Google Scholar 

  86. C.J. Powell, J. Electron Spectrosc. Relat. Phenom. 185, 1 (2012)

    Article  Google Scholar 

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Authors and Affiliations

  1. Max-Planck-Institute for Intelligent Systems (formerly Max-Planck-Institute for Metals Research), Heisenbergstrasse 3, 70569, Stuttgart, Germany

    Professor Dr. Siegfried Hofmann

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  1. Professor Dr. Siegfried Hofmann
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Correspondence to Siegfried Hofmann .

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Hofmann, S. (2013). Qualitative Analysis (Principle and Spectral Interpretation). In: Auger- and X-Ray Photoelectron Spectroscopy in Materials Science. Springer Series in Surface Sciences, vol 49. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-27381-0_3

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