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On Spectroscopic Diagnostics of Hot Optically Thin Plasmas

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Atomic Processes in Basic and Applied Physics

Part of the book series: Springer Series on Atomic, Optical, and Plasma Physics ((SSAOPP,volume 68))

Abstract

X-ray and extreme ultraviolet (XUV) emission spectra of highly charged ions in hot plasmas contain diverse information on both elementary processes and the ambient medium. The theoretical analysis of spectra and spectral images of laboratory and astrophysical sources of short-wave radiation, based on the modern methods of atomic data calculations of spectral and collisional ion characteristics, allows one to determine various physical parameters of the emitting plasma. Here, we consider and discuss some basic principles on which the spectroscopic diagnostics of hot optically thin plasmas emitting XUV spectra is based. In order to obtain information about the internal structure of a physical system under study, one generally needs to solve inverse problems for determining the physical conditions in the plasma. Using concepts from the probability theory, we formulate the spectral inverse problem in the framework of the probabilistic approach to be used for the temperature diagnostics of hot plasma structures. We then demonstrate applications of our diagnostics methods to hot plasmas in laboratory (tokamak plasma) and astrophysical (solar corona) conditions.

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Acknowledgements

We would like to thank our colleague Vladimir Slemzin for fruitfully collaborating on the subject of the present review. We also gratefully acknowledge the financial support from the European Commission Programme under the grant agreement 218816 (FP-7 SOTERIA project) and the Russian Foundation for Basic Research (project 11-02-01079-a)—Programme of the Presidium of the Russian Academy of Sciences “Plasma Processes in the Solar System.”

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Authors and Affiliations

  1. P.N. Lebedev Physical Institute, Leninskii prospekt 53, Moscow, Russia

    F. Goryaev

  2. P.N. Lebedev Physical Institute, Leninskii prospect 53, Moscow, Russia

    S. Oparin

Authors
  1. A. M. Urnov
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  2. F. Goryaev
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  3. S. Oparin
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Editors and Affiliations

  1. , Optical Department, P.N.Lebedev Physical Institute, Leninskii prospect 53, Moscow, 119991, Russia

    Viacheslav Shevelko

  2. , Plasma Physics, National Institute for Fusion Science, Oroshi 332-6, Toki, Gifu, 509-5292, Japan

    Hiro Tawara

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Urnov, A.M., Goryaev, F., Oparin, S. (2012). On Spectroscopic Diagnostics of Hot Optically Thin Plasmas. In: Shevelko, V., Tawara, H. (eds) Atomic Processes in Basic and Applied Physics. Springer Series on Atomic, Optical, and Plasma Physics, vol 68. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-25569-4_10

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  • DOI: https://doi.org/10.1007/978-3-642-25569-4_10

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