Abstract
In order to avoid the macroscopically inhomogeneous characteristics of large area films which prepared by Photo-assisted MOCVD (Metal Organic Chemical Vapor Deposition), processed by RIP (Rapid isothermal processing) technique, etc., the calculation of luminance uniformity is necessary. This thesis gives a basic calculation method about the radiation intensity of illumination caused by halogen-tungsten lamp like line radiation sources. A concept of average radiation intensity (ARI) of illumination was proposed to give quantification when radiation intensity is Rapidly Changed. The distribution of radiation sources influence on ARII is discussed. The numerical solution carried out by computer simulation directly confirms that the layout of radiation sources in this paper enhances the luminance uniformity. Consequently, the macroscopically inhomogeneous of the film is improved.
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References
Matsumura, T., Sato, Y.: A Theoretical Study on Van Der Pauw Measurement Values of Inhomogeneous Compound Semiconductor Thin Films. J. Mod. Phys. 1, 340–347 (2010)
Yom-Tov, N., Saguy, C., Bolker, A., Kalish, R., Yaish, Y.E.: Accurate Carrier-Type Determination of Nonhomogeneously Doped Diamond. Journal of Applied Physics 108, 043711 (2010)
Bierwagen, O., Ive, T., Van de Walle, C.G., Speck, J.S.: Causes of incorrect carrier-type identification in van der Pauw–Hall measurements. Applied Physics Letters 93, 242108 (2008)
Ikegami, K., Yoshiyama, T., Maejima, K., Shibata, H., Tampo, H., Niki, S.: Optical dielectric constant inhomogeneity along the growth axis in ZnO-based transparent electrodes deposited on glass substrates. Journal of Applied Physics 105, 093713 (2009)
Li, G., Fang, X., Zhao, L., Shanwen, Gao, Z., Li, W., Yin, J., Zhang, B., Du, G., Chou, P., He, L.: Chinping Chen. Physica C 468, 2213–2218 (2008)
Singh, R., Radpour, F., Chou, P.: Comparative study of dielectric formation by furnace and rapid isothermal processing. J. Vac. Sci. Technol. A7, 1456 (1989)
Michalowski, P., Schmidt, M., Schmidl, F., Grosse, V., Kuhwald, D., Katzer, C., Hübner, U., Seidel, P.: Engineering of YBa2Cu3O7–δ grain boundary Josephson junctions by Au nanocrystals. Physica Status Solidi - Rapid Research Letters 5, 268–270 (2011)
Ignatiev, A., Chou, P.C., Chen, Y., Zhang, X., Tang, Z.: Coated conductor development by photo-assisted MOCVD growth of YBCO thick films and buffer layers. Physica C 341–348, 2309–2313 (2000)
Zeng, J., Chou, P., Zhang, X., Tang, Z., Ignatiev, A.: Single liquid precursor delivery photo-assisted metalorganic chemical vapor deposition of high quality YBa2Cu3O7-x thin/thick films. Physica C 377, 235–238 (2002)
Zhong, Q., Chou, P.C., Li, Q.L., Taraldsen, G.S., Ignatiev, A.: High-rate growth of purely a-axis oriented YBCO high-Tc thin films by photo-assisted MOCVD. Physica C 246, 288–296 (1995)
Zhao, K., Zhong, X.: Optics, 1st edn., page 124. Beijin University Publishing Company (1984)
He, Z., Zheng, f.: Matlab, Numerical Analysis. Machine Press, Beijing (2009)
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Chen, J., Tan, Jw., Liu, Qh., Zhang, Fr. (2011). Computer Simulation and Calculation for Luminance Uniformity of Straight Line Radiation Sources. In: Liu, B., Chai, C. (eds) Information Computing and Applications. ICICA 2011. Lecture Notes in Computer Science, vol 7030. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-25255-6_95
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DOI: https://doi.org/10.1007/978-3-642-25255-6_95
Publisher Name: Springer, Berlin, Heidelberg
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