Abstract
Inverse Weibull distribution model has been recently proposed as a model in the analysis of life testing data. According to the distribution function of the Inverse Weibull distribution, concerning characters of failure data, the uniform distribution was taken as an prior distribution of the failure probability, in order to estimate the failure probability using the Bayes method. The least squares estimates of the distribution parameters were given, and Bayes estimation of failure probability was presented, so that the reliability assessment was obtained.
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References
Han, M.: Estimation of Parameter in the Case of Zero-Failure Data. Journal of Systems Science and Systems Engineering 10(4), 450–456 (2001)
Liu, H.-t., Zhang, Z.-h.: Bayesian Analysis of Zero-failure Data Based on IFRA Distribution. Journal of China Ordnance 5(1), 65–69 (2009)
Keller, A.Z., Kamath, A.R.R.: Alternative reliability models for mechanical systems. Paper presented at 3rd International conference on Reliability and Maintainability, Toulouse, France (1982)
Calabria, R., Pulcini, G.: Confidence limits for reliability and tolerance limits in the inverse Weibull distribution. Reliability Engineering and System Safety 24, 77–85 (1989)
Calabria, R., Pulcini, G.: Bayes probability intervals in a load-strength model. Comm. Statistics –Theory and Methods 21, 3393–3405 (1992)
Calabria, R., Pulcini, G.: On the maximum likelihood and leastsquares estimation in the inverse Weibull distribution. Statistica Applicata 2, 53–66 (1990)
Calabria, R., Pulcini, G.: Bayes 2-sample prediction for the inverse Weibull distribution. Commun. Statist. – Theory Meth. 23(6), 1811–1824 (1994)
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© 2011 Springer-Verlag Berlin Heidelberg
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Qingtian, H., Lian, L., Jia, C. (2011). Research on Bayes Reliability Assessment for Test Data. In: Ma, M. (eds) Communication Systems and Information Technology. Lecture Notes in Electrical Engineering, vol 100. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-21762-3_66
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DOI: https://doi.org/10.1007/978-3-642-21762-3_66
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-21761-6
Online ISBN: 978-3-642-21762-3
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