Abstract
We evaluate seven techniques for extracting unique signatures from NAND flash devices based on observable effects of process variation. Four of the techniques yield usable signatures that represent different trade-offs between speed, robustness, randomness, and wear imposed on the flash device. We describe how to use the signatures to prevent counterfeiting and uniquely identify and/or authenticate electronic devices.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Barboza, D.: In china, knockoff cellphones are a hit. The New York Times (April 2009)
Boning, D.S., Chung, J.E.: Statistical metrology: Understanding spatial variation in semiconductor manufacturing. In: Proceedings of SPIE 1996 Symposium on Microelectronic Manufacturing (1996)
Bowman, K.A., Duvall, S.G., Meindl, J.D.: Impact of die-to-die and within die parameter fluctuations on the maximum clock frequency distribution for gigascale integration. Journal of Solid-State Circuits 37(2), 183–190 (2002)
Cheng, J.: Beware of counterfeit ipods! Ars Technica (April 2006), http://arstechnica.com/apple/news/2006/04/3651.ars
Daniel, W.P.B., Holcomb, E., Fu, K.: Initial SRAM state as a fingerprint and source of true random numbers for RFID tags. In: Proceedings of the Conference on RFID Security
Gassend, B., Clarke, D., van Dijk, M., Devadas, S.: Silicon Physical Random Functions. In: Proceedings of the Computer and Communication Security Conference. ACM, New York (2002)
Grupp, L., Caulfield, A., Coburn, J., Swanson, S., Yaakobi, E., Siegel, P., Wolf, J.: Characterizing flash memory: Anomalies, observations, and applications. In: MICRO-42: 42nd Annual IEEE/ACM International Symposium on Microarchitecture, pp. 24–33 (December 2009)
Guajardo, J., Kumar, S.S., Schrijen, G.-J., Tuyls, P.: FPGA intrinsic pUFs and their use for IP protection. In: Paillier, P., Verbauwhede, I. (eds.) CHES 2007. LNCS, vol. 4727, pp. 63–80. Springer, Heidelberg (2007)
Lee, J.W., Lim, D., Gassend, B., Suh, G.E., van Dijk, M., Devadas, S.: A technique to build a secret key in integrated circuits for identification and authentication application. In: Proceedings of the Symposium on VLSI Circuits, pp. 176–179 (2004)
Lofstrom, K., Daasch, W.R., Taylor, D.: IC Identification Circuit Using Device Mismatch. In: Proceedings of ISSCC 2000, pp. 372–373 (February 2000)
Nassif, S.R.: Modeling and forecasting of manufacturing variations. In: Proceedings of ASP-DAC 2001, Asia and South Pacific Design Automation Conference 2001. ACM, New York (2001)
Pappu, R.: Physical One-Way Functions. PhD thesis, Massachusetts Institute of Technology (2001)
Morozov, P.S.S., Maiti, A.: A comparative analysis of delay based PUF implementations on FPGA. In: Proceedings of the 6th International Symposium on Applied Reconfigurable Computing (2010)
Kumar, R.M.G.S.S.S., Guajardo, J., Tuyls, P.: The butterfly PUF protecting IP on every FPGA. In: Proceedings of IEEE International Workshop on Hardware-Oriented Security and Trust (2008)
Su, Y., Holleman, J., Otis, B.: A 1.6pj/bit 96% stable chip-ID generating circuit using process variations. In: Proceedings of the IEEE International Solid-State Circuits Conference (ISSCC) (2007)
Suh, G.E., Devadas, S.: Physical Unclonable Functions for Device Authentication and Secret Key Generation. In: Proceedings of the 44th Conference on Design Automation (2007)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2011 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Prabhu, P. et al. (2011). Extracting Device Fingerprints from Flash Memory by Exploiting Physical Variations. In: McCune, J.M., Balacheff, B., Perrig, A., Sadeghi, AR., Sasse, A., Beres, Y. (eds) Trust and Trustworthy Computing. Trust 2011. Lecture Notes in Computer Science, vol 6740. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-21599-5_14
Download citation
DOI: https://doi.org/10.1007/978-3-642-21599-5_14
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-21598-8
Online ISBN: 978-3-642-21599-5
eBook Packages: Computer ScienceComputer Science (R0)