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Accurate Overlap Area Detection Using a Histogram and Multiple Closest Points

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Computer Vision and Graphics (ICCVG 2010)

Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 6375))

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Abstract

In this paper, we propose a novel ICP variant that uses a histogram in conjunction with multiple closest points to detect the overlap area between range images being registered. Tentative correspondences sharing similar distances are normally all within, or all outside, the overlap area. Thus, the overlap area can be detected in a bin by bin batch manner using a histogram. Using multiple closest points is likely to enlarge the distance difference for tentative correspondences in the histogram, and pull together the images being registered, facilitating the overlap area detection. Our experimental results based on real range images show that the performance of our proposed algorithm enhances the state of the art.

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Author information

Authors and Affiliations

  1. Department of Computer Science, Aberystwyth University, Ceredigion, SY23 3DB, UK

    Yonghuai Liu

  2. School of Computer Science & Informatics, Cardiff University, Cardiff, CF24 3AA, UK

    Ralph R. Martin

  3. Department of Computing Science, Texas A and M University, Corpus Christi, TX, 78412-5824, USA

    Longzhuang Li

  4. College of Computer Science, Zhejiang University, Hangzhou, 710072, P.R. China

    Baogang Wei

Authors
  1. Yonghuai Liu
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  2. Ralph R. Martin
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  3. Longzhuang Li
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  4. Baogang Wei
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Editor information

Editors and Affiliations

  1. Polish-Japanese Institute of Information Technology, 86 Koszykowa St, 02-008, Warsaw, Poland

    Leonard Bolc

  2. Institute of Automatics, AGH University of Science and Technology, Al. Mickiewicza 30, 30-059, Kraków, Poland

    Ryszard Tadeusiewicz

  3. Faculty of Applied Informatics and Mathematics, Department of Informatics, Warsaw University of Life Sciences, Nowoursynowska 159, 02-776, Warsaw, Poland

    Leszek J. Chmielewski

  4. Institute of Computer Science, The Silesian University of Technology, Akademicka 16, 44-100, Gliwice, Poland

    Konrad Wojciechowski

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© 2010 Springer-Verlag Berlin Heidelberg

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Liu, Y., Martin, R.R., Li, L., Wei, B. (2010). Accurate Overlap Area Detection Using a Histogram and Multiple Closest Points. In: Bolc, L., Tadeusiewicz, R., Chmielewski, L.J., Wojciechowski, K. (eds) Computer Vision and Graphics. ICCVG 2010. Lecture Notes in Computer Science, vol 6375. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-15907-7_13

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  • DOI: https://doi.org/10.1007/978-3-642-15907-7_13

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-15906-0

  • Online ISBN: 978-3-642-15907-7

  • eBook Packages: Computer ScienceComputer Science (R0)

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