Abstract
Accurate measurements are essential in high-frequency engineering. Depending on the functionality of the device under test (DUT), different types of measurements are required. Linear characteristics of microwave circuits and devices are usually measured using a vector network analyzer (VNA). The obtained S-parameters are used to describe the main performance characteristics of the networks operating in their linear range. For example, for an LNA the small-signal S-parameters describe its gain, reverse isolation and port matching. Also for instance, the main properties of a directional coupler such as e.g. amplitude and phase imbalance, insertion loss, isolation and port matching can be derived from its S-parameters.
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Issakov, V. (2010). Measurement Techniques. In: Microwave Circuits for 24 GHz Automotive Radar in Silicon-based Technologies. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-13598-9_5
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DOI: https://doi.org/10.1007/978-3-642-13598-9_5
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