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TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS

  • Conference paper
Advances in Software Engineering (ASEA 2009)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 59))

Abstract

The Testing and Test Control Notation Version 3 (TTCN-3) is an internationally standardized language for defining test specifications for a wide range of computer and telecommunication systems. Since embedded systems software is frequently used in case that safety is a primary issue and reliability is critical in the systems, it is necessary for the embedded systems software to use a systematic testing method such as TTCN-3. Unfortunately, the difference of testing environment between embedded and PC-based software makes developers hard to test the software, and hence products not tested thoroughly could be released in the market, which can be a potential disaster. In this paper, we review the TTCN-3 testing system and suggest a modified TTCN-3 testing environment for embedded systems software in Software In the Loop Simulation (SILS). A simple example shows our demonstration of testing embedded systems software based on the proposed TTCN-3 testing system.

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Authors and Affiliations

  1. School of Electrical Engineering and Computer Science, Kyungpook National University, 1370 Sankyuk-dong, Buk-gu, Daegu, Korea

    Hochang Chae, Xiulin Jin & Jeonghun Cho

  2. Daegu Gyeonbuk Institute of Science & Technology, Daegu Technopark Venture 1 Plant, 75 Gongdanbuk 2gil, Dalseo-gu, Daegu, Korea

    Seonghun Lee

Authors
  1. Hochang Chae
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  2. Xiulin Jin
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  3. Seonghun Lee
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  4. Jeonghun Cho
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Editor information

Editors and Affiliations

  1. Infobright Inc.,  

    Dominik Ślęzak

  2. Hannam University, 306-791, Daejeon, South Korea

    Tai-hoon Kim

  3. University of Michigan-Dearborn, Dearborn, MI, USA

    Akingbehin Kiumi

  4. University of California, Riverside, USA

    Tao Jiang

  5. National ICT, Australia

    June Verner

  6. Department of Information Systems and Computation, Valencia University of Technology, Camino de Vera s/n, P.O. Box: 22012, 46022, Valencia, Spain

    Silvia Abrahão

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© 2009 Springer-Verlag Berlin Heidelberg

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Chae, H., Jin, X., Lee, S., Cho, J. (2009). TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS. In: Ślęzak, D., Kim, Th., Kiumi, A., Jiang, T., Verner, J., Abrahão, S. (eds) Advances in Software Engineering. ASEA 2009. Communications in Computer and Information Science, vol 59. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-10619-4_25

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  • DOI: https://doi.org/10.1007/978-3-642-10619-4_25

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-10618-7

  • Online ISBN: 978-3-642-10619-4

  • eBook Packages: Computer ScienceComputer Science (R0)

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