Abstract
Materials are substances that have now, or are expected to find in a not too distant future, practical use (see Chap. 1). The microstructure of a material (beautifully described by the untranslatable German word “Gefüge”) is a notion that comprises all aspects of the atomic arrangement in a material that should be known in order to understand its properties. Mostly we are concerned with crystalline materials. The conception microstructure then narrows to the description of the so-called crystal imperfection (cf. Chap. 5).
This is a preview of subscription content, log in via an institution to check access.
Preview
Unable to display preview. Download preview PDF.
References
General
Amelinckx S, Van Dyck D, Van Landuyt J, Van Tendeloo G (1997) Handbook of microscopy, vol. 1–3. VCH Verlagsgesellschaft, Weinheim, Germany
de Graef M (2003) Introduction to convential transmission electron microscopy. Cambridge University Press, Cambridge
Mittemeijer EJ, Scardi P (eds) (2004) Diffraction analysis of the microstructure of materials. Springer Series in Materials Science, vol. 68. Springer, Berlin, Heidelberg, New York
Warren BE (1969) X-ray diffraction. Addison-Wesley, Reading, MA
Williams DB, Carter CB (1996) Transmission electron microscopy, vols. I–IV. Plenum Press, New York
Specific
van Berkum JGM, Delhez R, de Keijser ThH, Mittemeijer EJ (1996) Diffraction-line broadening due to strain fields in materials. Acta Crystallographica A52:730–747
Delhez R, de Keijser ThH, Mittemeijer EJ (1982) Determination of crystallite size and lattice distortions through X-ray diffraction line profile analysis. Recipes, methods and comments. Fresenius Zeitschrift für Analytische Chemie 312:1–16
Drent P (2005) Properties and selection of objective lenses for light microscopical applications. Microscopy Anal 19:5–7
Hauk V (ed) (1997) Structural and residual stress analysis by nondestructive methods; evaluation-application-assessment. Elsevier, Amsterdam
Horn E, Zantl R (2006) Phase-contrast light microscopy of living cells cultured in small volumes. Microscopy Anal 20:15–17
Kumar A, Welzel U, Mittemeijer EJ (2006) Depth dependence of elastic grain interaction and mechanical stress: analysis by X-ray diffraction measurements at fixed penetration/information depths. J Appl Phys 100:114904
Mittemeijer EJ, Welzel U (2008) The “state of the art” of the diffraction analysis of crystallite size and lattice strain. Zeitschrift für Kristallographie 223:552–560
Noyan IC, Cohen JB (1978) Residual stress; measurement by diffraction and interpretation. Springer, New York
Sato A, Mori N, Takakura M, Notoya S (2007) Examination of analytical conditions for trace elements based on the detection limit of EPMA (WDS). JEOL News 42E:46–52
Urban KW (2007) The new paradigm of transmission electron microscopy. MRS Bull 32:946–952
Welzel U, Ligot J, Lamparter P, Vermeulen AC, Mittemeijer EJ (2005) Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction (Review). J Appl Crystallography 38:1–29
Williamson GK, Smallman RE (1956) Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray Debye-Scherrer spectrum. Philos Mag 1:34–46
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2010 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Mittemeijer, E.J. (2010). Analysis of the Microstructure; Analysis of Lattice Imperfections: Light and Electron Microscopical and X-Ray Diffraction Methods. In: Fundamentals of Materials Science. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-10500-5_6
Download citation
DOI: https://doi.org/10.1007/978-3-642-10500-5_6
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-10499-2
Online ISBN: 978-3-642-10500-5
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)