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Magnetic Imaging with X-rays

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Magnetism and Synchrotron Radiation

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 133))

Abstract

Looking into a magnetic system with X-rays and revealing its secrets by imaging fuels a powerful and beautiful area of research. Magnetic imaging with X-rays allows us to understand and engineer the magnetic properties of thin films, heterostructures, and nanoscale magnets. In this chapter, the underlying concepts of imaging magnetic systems with X-rays are presented, and different microscope techniques are described.

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Acknowledgements

This tutorial chapter is based on many successful collaborations, which I had have over the years. In particular, the following people are acknowledged with whom I made either the shown experiments, which helped me with figures or useful discussions: L. Heyderman, A. Fraile Rodriguez, S. Czekaj, L. Joly, L. Le Guyader, E. Mengotti, A. Kleibert, C. Quitmann, J. Raabe, I. Schmid, J. Lüning, and A. Scholl.

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Authors and Affiliations

  1. Swiss Light Source, Paul Scherrer Institut, 5232, Villigen, PSI, Switzerland

    F. Nolting

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  1. F. Nolting
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Correspondence to F. Nolting .

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Editors and Affiliations

  1. CNRS-UMR 7504, Inst. Physique et Chimie des, Université Strasbourg, rue du Loess 22, Strasbourg CX 2, 67034, France

    Eric Beaurepaire

  2. CNRS-UMR 7504, Inst. Physique et Chimie des, Université Strasbourg, rue du Loess 22, Strasbourg CX 2, 67034, France

    Hervé Bulou

  3. CNRS-UMR 7504, Inst. Physique et Chimie des, Université Strasbourg, rue du Loess 22, Strasbourg CX 2, 67034, France

    Fabrice Scheurer

  4. CNRS-UMR 7504, Inst. Physique et Chimie des, Université Strasbourg, rue du Loess 22, Strasbourg CX 2, 67034, France

    Kappler Jean-Paul

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Nolting, F. (2010). Magnetic Imaging with X-rays. In: Beaurepaire, E., Bulou, H., Scheurer, F., Jean-Paul, K. (eds) Magnetism and Synchrotron Radiation. Springer Proceedings in Physics, vol 133. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-04498-4_12

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  • DOI: https://doi.org/10.1007/978-3-642-04498-4_12

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