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A. Terawaki, Y. Otsuka, H.Y. Lee, T. Matsumoto, H. Tanaka, T. Kawai, Appl. Phys. Lett. 86, 113901 (2005)
N. Rehse, S. Marr, S. Scherdel, and R. Magerle, Adv. Mater. 17, 2203 (2005)
N.H. Thomson, J. Microscopy 217, 193 (2005)
P. Samori, Chem. Soc. Rev. 34, 551 (2005)
G. Leveque, P. Cadet, and R. Arinero, Phys. Rev. B 71, 205419 (2005)
M. Tello, R. Garcia, J.A. Martín-Gago, N.F. Martinez, M.S. Martin-Gonzalez, L. Aballe, A. Barinov, and L. Gregoratti, Adv. Mater. 17, 1480 (2005).
C.M. Stroch, A. Ebner, M. Geretschlager, G. Freudenthaler, F. Kienberger, A.S.M. Kamruzzahan, S.J. Smith-Gil, H.J. Gruber and P. Hinterdorfer, Biophys. J 87, 1981 (2004)
O. Sahin, C.F. Quate, O. Sogaard, and A. Atalar, Phys. Rev. B 69, 165416 (2004)
T. Fukuma, K. Kimura, K. Kobayashi, K. Matsushige and H. Yamada, Appl. Phys. Lett. 85, 6287 (2004).
L. Chen, C.L. Cheung, P.D. Ashby, C.M. Lieber, Nano Lett. 4, 1725 (2005)
R.J. Colton, J. Vac. Sci. technol. B 22, 1609 (2004)
T.R. Rodriguez and R. Garcia, Appl. Phy. Lett. 449, 84 (2004)
S.I. Lee, S.W. Howell, A. Raman, R. Reifenberger, C.V Nguyen, M. Meyyappan, Nanotechnology 15, 416–421 (2004)
S.D. Solares, Y. Matsuda, W.A. Goddard, J. Phys. Chem. B 109(35), 16658 (2005)
C. Su, L. Huang, K. Kjoller and K. Babcock, Ultramicroscopy 97, 135 (2003)
M.F. Yu, T. Kowalewski, R.S. Ruoff, Phys. Rev. Lett. 86, 87 (2001)
R. Garcia and R. Perez, Surf. Sci. Rep. 47, 197 (2002)
B. Pignataro, L. Chi, S. Gao, B. Anczykowski, C. Niemeyer, M. Adler and H. Fuchs, Appl. Phys. A 74, 447 (2002)
M. Stark, R. W. Stark, W. M. Heckl, and R. Guckenberger, Proc. Natl. Acad. Sci. USA 99, 8473 (2002).
G. Reiter, G. Castelein, J.U. Sommer, A. Röttele and T. Thurn-Albrecht, Phys. Rev. Lett. 87, 2261 (2001)
L. Nony, R. Boisgard, and J.P. Aimé, Biomacromolecules 2, 827 (2001)
J. Tamayo, ADL Humpris, and M. Miles, Appl. Phys. Lett. 77, 582 (2000)
R. Garcia and A. San Paulo, Phys Rev B 61, R13381 (2000)
R. Garcia and A. San Paulo, Phys. Rev. B 60, 4961 (1999)
A. Kühle, A.H. Soerensen and J. Bohr, J. Appl. Phys. 81, 6562 (1997)
A. S. Paulo and R. Garcia, Phys. Rev. B 66, 041406 (2002)
B. Anczykowski, J. Cleveland, D. Krüger, V. Elings and H. Fuchs, Appl. Phys. A 66, S885 (1998)
R. García, J. Tamayo, A. San Paulo, Surf. Interf. Anal. 27, 312 (1999)
N.F. Martinez and R. Garcia, Nanotechnology (2006)
T.R. Rodriguez and R. Garcia, Appl. Phys. Lett. (2002)
P. Martin, S. Marsaudon, J.P. Aimé, B. Bennetau, Nanotechnology 16, 901 (2005)
P.M. Hoffmann, S. Jeffery, J.B. Pethica, H. Ozgür, A. Oaral, Phys. Rev. Lett. 87, 265502 (2001)
T. Trevethan and L. Kantorovich, N anotechnology 16, S79 (2005)
E. Meyer, H.J. Hug and R. Bennewitz, Scanning Probe Microscopy Springer-Verlag Berlin (2004)
M. Kageshima, S. Takeda, A. Ptak, C. Nakamura, S.P. Jarvis, H. Tokumoto and J. Miyake, Jap J. Appl. Phys. 43, L1510 (2004)
A. Schirmeisen and H. Hölscher, Phys. Rev. B 72, 045431 (2005)
N. Sasaki and M. Tsukada, Jap. J. Appl. Phys. 39, L1334 (2000)
B. Gotsmann, C. Seidel, B. Anczykowski, and H. Fuchs, Phys. Rev. B 60, 11051 (1999)
H. Yoshizawa, Y.-L. Chen and J. Israelachvili, J. Phys. Chem. 97, 4128 (1993)
J. Tamayo and R. Garcia, Appl. Phys. Lett. 71, 2394 (1997)
J. Tamayo and R. Garcia, Appl. Phys. Lett. 73, 2926 (1998)
G. Bar, Y. Thomann, M.H Whangbo, Langmuir 14, 1219 (1998)
O.P. Behrend, L. Odoni, J.L. Loubet and N.A. Burnham, Appl. Phys. Lett. 75, 2551 (1999)
M. Stark, C. Möller, D.J. Müller and R. Guckenberger, Biophys. J. 80, 3009 (2001)
A. San Paulo and R. Garcia, Phys. Rev. B 64, 193411 (2001)
G. Kraush and R. Magerle, Adv. Mater. 14, 1579 (2002)
B. Bhushan and J. Qi, Nanotechnology 14, 886 (2003)
X. Chen, C.J. Roberts, J. Zhang, M.C. Davies and S.J.B. Tendler, Surf. Sci. 519, L593 (2002)
M. Balantekin and A. Atalar, Phys. Rev. B 67, 193404 (2003)
M.J. D’Amato, M.S. Markus, D.Y. Sasaki and R.W. Carpick, Appl. Phys. Lett. 85, 4738 (2004)
H. Bodiguel, H. Montes and C. Fretigny, Rev. Sci. Intrum. 75, 2529 (2004)
S. Crittenden, A: Raman, and R. Reifenberger, Phys. Rev. B 72, 235422 (2005).
P.D. Ashby and C.M. Lieber, J. AM. Chem. Soc. 127, 6814 (2005)
W. Wu, K. Matyjaszewski, and T. Kowalewski, Langmuir 21, 1143 (2005).
R.V. Martinez, F. Garcia, R. Garcia, E. Coronado, A. Forment-Aliaga, F.M. Romero and S. Tatay, Adv. Mater. (submitted).
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García, R., Martínez, N.F., Gómez, C.J., García-Martín, A. (2007). Energy Dissipation and Nanoscale Imaging in Tapping Mode AFM. In: Gnecco, E., Meyer, E. (eds) Fundamentals of Friction and Wear. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-36807-6_17
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