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Dielectric Characterisation of High Loss and Low Loss Materials at 2450 MHz

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Advances in Microwave and Radio Frequency Processing

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Literature

  1. Sucher and Fox (ed), “Handbook Of Microwave Measurements”, vol II, Dielectric constant, Polytechnic Press, 1963, pp. 502 & 512.

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Author information

Authors and Affiliations

  1. Microwave Research Laboratory, RMIT, Australia

    Andrew Y.J Lee

  2. Microwave Research Laboratory, IRIS, Swinburne University, Melbourne, Victoria, Australia

    V. Nguyen Tran

Authors
  1. Andrew Y.J Lee
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  2. V. Nguyen Tran
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Editor information

Editors and Affiliations

  1. Chair of Materials Processing, University of Bayreuth, Universitätsstraße 30, D-95447, Bayreuth, Germany

    Monika Willert-Porada

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© 2006 Springer-Verlag Berlin Heidelberg

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Lee, A.Y., Tran, V.N. (2006). Dielectric Characterisation of High Loss and Low Loss Materials at 2450 MHz. In: Willert-Porada, M. (eds) Advances in Microwave and Radio Frequency Processing. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-32944-2_9

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