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Experimental Technique and Working Modes

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Kelvin Probe Force Microscopy

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 65))

Abstract

Kelvin probe force microscopy (KPFM) is a scanning probe microscopy technique providing the capability to image the surface potential of a sample with high spatial and energy resolution. It is based on non-contact atomic force microscopy (nc-AFM) and continuously minimizes the electrostatic interaction between the scanning tip and the surface. Compared to electrostatic force microscopy (EFM) which also measures the electrostatic properties KPFM compensates these force contributions. The two main working modes are the amplitude modulation and the frequency modulation technique, in which the electrostatic force or the electrostatic force gradient are minimized by the application of an appropriate dc-bias voltage, respectively. For metals and semiconductors, the contact potential difference is determined, which is related to the sample’s work function, while for insulators information about local charges and dipoles is obtained. This chapter provides a brief introduction to nc-AFM, EFM, and various KPFM techniques.

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Notes

  1. 1.

    In principle, the definition of the CPD could also be selected as \(V_{CPD} = (\varPhi _{tip} - \varPhi _{sample})/e\), which corresponds to \(-V_{CPD}\) of (1.13). Typically the definition of (1.13) is selected such that the changes in \(V_{CPD}\) directly correspond to changes in the work function. Thus, images of \(V_{CPD}\) represent the same contrast as images of the sample’s work function \(\varPhi _{sample}\), just with a constant absolute offset, which is equal to the work function of the tip. In the experimental realization this would correspond to a situation, where the voltage is applied to the sample and the tip is grounded (see Sect. 1.4.3).

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Authors and Affiliations

  1. International Iberian Nanotechnology Laboratory, Avenida Mestre Jos Veiga s/n, 4715-330, Braga, Portugal

    Sascha Sadewasser

  2. Department of Physics, University of Basel, Klingelbergstr. 82, 4056, Basel, Switzerland

    Thilo Glatzel

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  1. Sascha Sadewasser
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Correspondence to Sascha Sadewasser .

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Editors and Affiliations

  1. International Iberian Nanotechnology Laboratory, Braga, Portugal

    Sascha Sadewasser

  2. Department of Physics, University of Basel, Basel, Switzerland

    Thilo Glatzel

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Sadewasser, S., Glatzel, T. (2018). Experimental Technique and Working Modes. In: Sadewasser, S., Glatzel, T. (eds) Kelvin Probe Force Microscopy. Springer Series in Surface Sciences, vol 65. Springer, Cham. https://doi.org/10.1007/978-3-319-75687-5_1

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