Abstract
Confocal Raman spectroscopy has emerged as a key characterization technique in graphene research, as with this technique important material characteristics can be obtained locally and noninvasively. In this chapter, the fundamentals of the Raman spectrum of graphene are reviewed and the utilization of Raman spectroscopy for graphene characterization is demonstrated. In this regard, we show how crucial properties of graphene samples, i.e. doping , strain , defect-density and layer-number can be extracted from the Raman spectrum. Accessing these quantities is highly relevant for monitoring, understanding and improving graphene synthesis processes and device fabrication techniques for research and emerging industrial applications.
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Notes
- 1.
The ‘D’ here indeed stands for defect.
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Acknowledgements
The authors wish to thank Sven Reichardt, Marc Drögeler, Luca Banszerus, Michael Schmitz, Donatus Halpaap, Bernat Terrés, Takashi Taniguchi, Kenji Watanabe, Slava V. Rotkin, Francesco Mauri, Pedro Venezuela and Bernd Beschoten, who contributed in different ways to the sample fabrication, measurements and data interpretation shown in this chapter.
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Neumann, C., Stampfer, C. (2018). Characterization of Graphene by Confocal Raman Spectroscopy. In: Toporski, J., Dieing, T., Hollricher, O. (eds) Confocal Raman Microscopy. Springer Series in Surface Sciences, vol 66. Springer, Cham. https://doi.org/10.1007/978-3-319-75380-5_8
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