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Nanostructured Oxides: Cross-Sectional Scanning Probe Microscopy for Complex Oxide Interfaces

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Advances in Nanomaterials

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Abstract

The electronic properties of the interfaces between two dissimilar materials have shown emerging phenomena that are not seen in the composed bulk counterparts. For example, the phenomena at semiconductor interfaces provided the foundation of modern electronic devices for decades. Recently, complex oxide materials exhibit a variety of functionalities owing to its strong coupling nature, in which the electron entity coupled strongly to lattice, orbital, and spin degrees of freedom. The interfaces of dissimilar complex oxides have even shown intriguing properties not seen in the composite bulk complex oxide materials. These interfacial phenomena carry the promises for the next-generation electronic devices and many other applications. With the development of the synthesis techniques, controllable high-quality complex oxide heterojunctions can now be routinely fabricated. On the other hand, the characterization tools that aim to probe the interfacial properties are still needed. Among the developing tools, the cross-sectional scanning probe microscopy (XSPM) provides the valuable information on resolving the local physical properties at interfaces in atomic-scale. Here, we briefly reviewed the recent developed XSPM and focused on distinct phenomena that were studied by it.

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Acknowledgements

TYC acknowledges the U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering for financial support (DEFG02-10ER46728).

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  1. Department of Physics and Astronomy, University of Wyoming, Laramie, WY, 82071, USA

    TeYu Chien

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Correspondence to TeYu Chien .

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  1. Lehigh University, Bethlehem, Pennsylvania, USA

    Ganesh Balasubramanian

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Chien, T. (2018). Nanostructured Oxides: Cross-Sectional Scanning Probe Microscopy for Complex Oxide Interfaces. In: Balasubramanian, G. (eds) Advances in Nanomaterials. Springer, Cham. https://doi.org/10.1007/978-3-319-64717-3_5

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