Abstract
We developed a novel scanning probe microscope (SPM) technique for fine processing of material surface using a localized fine atmospheric pressure plasma jet (APPJ) generated from a nanopipette. The nanopipette is a tapered glass capillary with an aperture of sub-micrometer. Using the nanopipette as a nozzle, it was possible to localize irradiation area of the APPJ. The nanopipette could also be used as a probe for a scanning probe microscope operated with shear-force feedback control, which is capable of positioning the pipette edge in the vicinity of material surfaces for APPJ processing. By using the SPM system, sub-micrometer holes were successfully fabricated.
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Iwata, F., Morimatsu, D., Sugimoto, H., Nakamura, A., Ogino, A., Nagatsu, M. (2017). Scanning Nanopipette Probe Microscope for Nanofabrication Using Atmospheric Pressure Plasma Jet. In: Jabłoński, R., Szewczyk, R. (eds) Recent Global Research and Education: Technological Challenges. Advances in Intelligent Systems and Computing, vol 519. Springer, Cham. https://doi.org/10.1007/978-3-319-46490-9_16
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DOI: https://doi.org/10.1007/978-3-319-46490-9_16
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