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Nyquist Analog-to-Digital Conversion

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Analog-to-Digital Conversion

Abstract

Several classifications exist of Nyquist-rate analog-to-digital converters. In this chapter the converters are subdivided into parallel search, sequential search, and linear search. Each of these architectures requires a comparator. Therefore this building block is extensively analyzed in all its aspects. The section is concluded with a comparator catalog.The full-flash converter is the conversion solution for the highest speed range. Moreover it is a building block for more complex converters. Variants such as gain stage, interpolation, and folding are analyzed and described.The sub-ranging methods and pipeline converters are the solutions for the medium speed range demands. Next to a treatise on the various aspects of the architecture an analysis is made of the error sources, calibration techniques, and design issues.In the next sections the successive approximation and linear topologies are discussed. These topologies are slower but receive today more attention as a massive parallelism allows them to compete with the performance of the pipeline converter. The issues associated with multiplexing are analyzed.Finally some less prominent ideas for conversion are briefly highlighted.

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Notes

  1. 1.

    Paraphrasing prof. Bram Nauta.

  2. 2.

    This bandwidth can start at DC, but also far above f s using down-sampling in Sect. 2.3.2

  3. 3.

    The term saturation is used to indicate that the circuit is far out of its operating point. Saturation of circuits has no relation with the operating regime of a transistor.

  4. 4.

    This voltage-delay relation can be exploited: measuring the delay is used to quantify the input voltage and create more resolution.

  5. 5.

    Dr. Richard Schreier comment is that metastability is based on the idea that voltages can be scaled down continuously: mV, μV, nV,…However, is there a limit given by the quantum character on atomic level?

  6. 6.

    The origin of the addition “full” in full-flash can refer to the conversion of the full range. “Partial-flash” converters can refer to a subranging architecture.

  7. 7.

    A potential test is to lower the digital amplitude by decreasing the digital power supply. If the distortion is reacting, then a coupling path must exist.

  8. 8.

    An often encountered error in a measurement set-up is a direct connection between the ADC chip and the input port of a laptop. Certainly some spurs related to the internal processing will be visible in the analog-to-digital conversion spectrum.

  9. 9.

    Some similarity exists with the way a monkey climbs a tree.

  10. 10.

    See data sheets from ADI, TI, and NXP. Some product numbers: AD9640, AD6645, ADS5474, and ADC1410. In some data sheets these converters are called pipeline converters. In the terminology of this book they are classified as subrange converters.

  11. 11.

    Be aware of bias noise and power supply variations, these can produce dependent errors.

  12. 12.

    This is not a sufficient condition as timing errors and the errors in the succeeding stages are ignored.

  13. 13.

    Watch out for the successive approximation converter!

  14. 14.

    This research was presented at the 2010 ISSCC forum, and still waits for some spare time to write a publication.

  15. 15.

    Don’t be surprised to see 10 mA flow into this part of the circuit. This aspect is hardly mentioned in F.o.M boosting designs.

  16. 16.

    You better do a good lay-out!

  17. 17.

    There is no equal sign between both formulas as they differ for the quantization error.

  18. 18.

    This section is based on a design by J. v. Rens.

  19. 19.

    The general form of this principle is in [261] identified as the Sweeney–Robertson–Tocher division principle.

  20. 20.

    Crest factor is the ratio between highest amplitude and average amplitude.

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Pelgrom, M. (2017). Nyquist Analog-to-Digital Conversion. In: Analog-to-Digital Conversion. Springer, Cham. https://doi.org/10.1007/978-3-319-44971-5_8

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  • DOI: https://doi.org/10.1007/978-3-319-44971-5_8

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