Skip to main content

Characterization and Specification

  • Chapter
  • First Online:
Analog-to-Digital Conversion
  • 5603 Accesses

Abstract

The specification of the converter is a dominant mechanism to align the wishes of the user to the possibilities of the designer. Directly coupled to the specification is the measurement technique that serves to establish a numerical value for a theoretical concept. This chapter discusses the fundamentals of the characterization and measurement techniques, such as histogram testing.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 69.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 89.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Notes

  1. 1.

    Your author is no MatLab wizard, this example comes without any guarantee.

  2. 2.

    Also called: “missing-tone power ratio.”

Bibliography

  1. IEEE (1994) IEEE Std 1057–1994 IEEE standard for digitizing waveform recorders

    Google Scholar 

  2. IEEE (2000) IEEE 1241–2000, Standard for terminology and test methods for analog-to-digital converters. IEEE Std 1241. ISBN:0-7381-2724-8, revision 2007

    Google Scholar 

  3. Tilden SJ, Linnenbrink TE, Green PJ (1999) Overview of IEEE-STD-1241 standard for terminology and test methods for analog-to-digital converters. In: Instrumentation and measurement technology conference, pp 1498–1503

    Google Scholar 

  4. Scholtens PCS, Vertregt M (2002) A 6-b 1.6-Gsample/s flash ADC in 0.18μm CMOS using averaging termination. IEEE J Solid-State Circuits 37:1599–1609

    Article  Google Scholar 

  5. Irons FH (2000) The noise power ratio – theory and adc testing. IEEE Trans Instrum Meas 49:659–665

    Article  Google Scholar 

  6. Milor LS (1998) A tutorial introduction to research on analog and mixed-signal circuit testing. IEEE Trans Circuits Syst II 45:1389–1407

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 2017 Springer International Publishing Switzerland

About this chapter

Cite this chapter

Pelgrom, M. (2017). Characterization and Specification. In: Analog-to-Digital Conversion. Springer, Cham. https://doi.org/10.1007/978-3-319-44971-5_11

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-44971-5_11

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-44970-8

  • Online ISBN: 978-3-319-44971-5

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics