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Raman Spectroscopy

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Spectroscopic Analysis of Optoelectronic Semiconductors

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 202))

Abstract

Deals with lattice vibrations studied by Raman spectroscopy. First, a description of the fundamentals of this technique is provided. Special emphasis is paid to a detailed description of the main experimental issues, e.g. spectrometers, detectors, optics, and how to use them. A detailed analysis of the “information depth” and lateral resolution is given. A discussion of the alternatives to improve the resolution is presented, in particular, the confocality, and tip enhanced methods are introduced. Several case applications highlighting the capabilities of the technique are presented; in particular, the measurement of stresses in silicon based devices, the coupled phonon-plasmon modes that allow to study in a contact-less way the transport parameters at a submicron scale; the use of the micro-Raman spectroscopy as local temperature probe, or the influence of the low dimensionality in the Raman spectrum are presented.

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Authors and Affiliations

  1. Condensed Matter Physics, University of Valladolid, Valladolid, Spain

    Juan Jimenez

  2. Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, Berlin, Germany

    Jens W. Tomm

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Jimenez, J., Tomm, J.W. (2016). Raman Spectroscopy. In: Spectroscopic Analysis of Optoelectronic Semiconductors. Springer Series in Optical Sciences, vol 202. Springer, Cham. https://doi.org/10.1007/978-3-319-42349-4_3

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