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Product Line Fault Tree Analysis by Means of Multi-valued Decision Diagrams

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Measurement, Modelling and Evaluation of Dependable Computer and Communication Systems (MMB&DFT 2016)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 9629))

Abstract

The development of cyber-physical systems such as highly integrated, safety-relevant automotive functions is challenged by an increasing complexity resulting from both customizable products and numerous soft- and hardware variants. In order to reduce the time to market for scenarios like these, a systematic analysis of the dependencies between functions, as well as the functional and technical variance, is required (cf. ISO 26262). In this paper we introduce a new approach which allows for a compact representation and analysis of failure mechanisms of systems marked by numerous variants, also: Product Line Fault Tree (PLFTs), in a unified data structure based on Multi-valued Decision Diagram (MDDs). Therefore, instead of analyzing the Fault Tree (FT) of each variant separately, the proposed method enables one to analyze the FT in a single step. Summing up, this article introduces a systematic modeling concept to analyze fault propagation in variant-rich systems.

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Notes

  1. 1.

    For reasons of simplicity we henceforth write MDD instead of ROMDD.

  2. 2.

    A minterm is a product term in which each variable appears once. Boolean functions can be expressed as sum of minterms where each minterm corresponds to a row of the function’s truth table. This final value of the function’s output is 1.

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Acknowledgment

Partially funded by the project SPES XT of the German Federal Ministry of Education and Research (grant no. 01IS12005C).

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Authors and Affiliations

  1. Audi Electronics Venture GmbH, Gaimersheim, Germany

    Michael Käßmeyer

  2. Friedrich-Alexander-Universität Erlangen-Nürnberg, Erlangen, Germany

    Rüdiger Berndt, Peter Bazan & Reinhard German

Authors
  1. Michael Käßmeyer
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  2. Rüdiger Berndt
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  3. Peter Bazan
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  4. Reinhard German
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Corresponding author

Correspondence to Michael Käßmeyer .

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Editors and Affiliations

  1. Universität Münster, Münster, Germany

    Anne Remke

  2. University of Twente, Enschede, The Netherlands

    Boudewijn R. Haverkort

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Käßmeyer, M., Berndt, R., Bazan, P., German, R. (2016). Product Line Fault Tree Analysis by Means of Multi-valued Decision Diagrams. In: Remke, A., Haverkort, B.R. (eds) Measurement, Modelling and Evaluation of Dependable Computer and Communication Systems. MMB&DFT 2016. Lecture Notes in Computer Science(), vol 9629. Springer, Cham. https://doi.org/10.1007/978-3-319-31559-1_11

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  • DOI: https://doi.org/10.1007/978-3-319-31559-1_11

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-31558-4

  • Online ISBN: 978-3-319-31559-1

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