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Constant-Stress Accelerated Life-Test Models and Data Analysis for One-Shot Devices

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Principles of Performance and Reliability Modeling and Evaluation

Part of the book series: Springer Series in Reliability Engineering ((RELIABILITY))

Abstract

In reliability analysis, accelerated life-tests are commonly used for inducing rapid failures, thus producing more lifetime information in a relatively short period of time. A link function relating stress levels and lifetimes is then utilized to extrapolate lifetimes of units from accelerated conditions to normal operating conditions. In the context of one-shot device testing, encountered commonly in testing devices such as munitions, rockets, and automobile air bags, either left- or right-censored data are collected instead of actual lifetimes of the devices under test. In this chapter, we study binary response data of one-shot devices collected from constant-stress accelerated life-tests, and discuss the analysis of such one-shot device testing data under accelerated life-tests based on parametric and semi-parametric models. In addition, a competing risks model is introduced into the one-shot device testing analysis under constant-stress accelerated life-test setting. Finally, some numerical examples are presented to illustrate the models and inferential results discussed here.

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Acknowledgments

Our sincere thanks go to the editors of this volume for extending an invitation to us which provided an impetus for preparing this overview article.

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Authors and Affiliations

  1. Department of Mathematics and Statistics, McMaster University, 1280 Main Street West, Hamilton, ON, L8S 4K1, Canada

    Narayanaswamy Balakrishnan & Hon Yiu So

  2. Department of Mathematics and Information Technology, The Hong Kong Institute of Education, Hong Kong Sar, China

    Man Ho Ling

Authors
  1. Narayanaswamy Balakrishnan
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  2. Man Ho Ling
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  3. Hon Yiu So
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Corresponding author

Correspondence to Narayanaswamy Balakrishnan .

Editor information

Editors and Affiliations

  1. University of Massachusetts Dartmou, Dartmouth, Massachusetts, USA

    Lance Fiondella

  2. Università degli studi di Messina, Messina, Italy

    Antonio Puliafito

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Balakrishnan, N., Ling, M.H., So, H.Y. (2016). Constant-Stress Accelerated Life-Test Models and Data Analysis for One-Shot Devices. In: Fiondella, L., Puliafito, A. (eds) Principles of Performance and Reliability Modeling and Evaluation. Springer Series in Reliability Engineering. Springer, Cham. https://doi.org/10.1007/978-3-319-30599-8_4

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  • DOI: https://doi.org/10.1007/978-3-319-30599-8_4

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-30597-4

  • Online ISBN: 978-3-319-30599-8

  • eBook Packages: EngineeringEngineering (R0)

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