Abstract
The use of Cs as an adsorbate of interest on metals and semiconductors extends back to the early work of Langmuir in this area. Several types of sources have been used, including sources that use elemental liquid Cs [1, 16–18], and Cs+ surface ionization sources [2, 3].
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
J.-L. Desplat, C.A. Papageorgopoulos, Surf. Sci. 92, 97 (1980)
G.S. Tompa, J.L. Lopes, G. Wohlrab, Rev. Sci. Instrum. 58, 1536 (1987)
T. Castro, R. Reifenberger, Rev. Sci. Instrum. 58, 289 (1987)
R.D. Swenumson, U. Even, Rev. Sci. Instrum. 52, 559 (1981)
D.G. Welkie, in Secondary Ion Mass Spectrometry SIMS V, ed. by A. Benninghoven et al. (Springer, New York, 1986), p. 146
G.R. Brewer, Ion Propulsion (Gordon and Breach, New York, 1970), Chap. 4
A.E. Souzis, W.E. Carr, S.I. Kim, and M. Seidl, Rev. Sci, Instrum. 61, 788 (1990)
D.W. Breck, Zeolite Molecular Sieves (Wiley, New York, 1977), Chap. 7
R.E. Weber, L.F. Cordes, Rev. Sci. Instrum. 37, 112 (1966)
T.E. Madey, J.T. Yates Jr., J. Vac. Sci. Technol. 8, 39 (1971)
M.J. Hogan, P.P. Ong, Rev. Sci. Instrum. 61, 1338 (1990)
D.A. Dahl, J.E. Delmore, The SIMION PC/PS2 User’s Manual, Version 3.1, Informal Report, EGG-CS-7233, Rev. 2 (November 1987). Program available from Idaho National Engineering Laboratory, EG&G Idaho, Inc., P.O. Box 1625, Idaho Falls, ID 83415
S.T. Beck, D.W. Warner, B.A. Garland, F.V. Wells, Rev. Sci. Instrum. 60, 2653 (1989)
Y. Satoh, M. Takebe, K. Linuma, Rev. Sci. Instrum. 58, 138 (1987)
D.W. Hughes, R.K. Feeney, D.N. Hill, Rev. Sci. Instrum. 51, 1471 (1980)
P.P. Ong, T.L. Tan, Rev. Sci. Instrum. 65, 3729 (1994)
H.B. Haskell, O. Heinz, D.C. Lorents, Rev. Sci. Instrum. 37, 607 (1966)
T.L. Tan, Z.L. Zhou, P.P. Ong, Rev. Sci. Instrum. 66, 2879 (1995)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2015 Springer International Publishing Switzerland
About this chapter
Cite this chapter
Yates, J.T. (2015). Ions. In: Experimental Innovations in Surface Science. Springer, Cham. https://doi.org/10.1007/978-3-319-17668-0_39
Download citation
DOI: https://doi.org/10.1007/978-3-319-17668-0_39
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-17667-3
Online ISBN: 978-3-319-17668-0
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)