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Simulating Solid-Liquid Interfaces in Atomic Force Microscopy

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Noncontact Atomic Force Microscopy

Part of the book series: NanoScience and Technology ((NANO))

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Abstract

In this chapter, we will cover the main approaches taken to model AFM in liquids in a variety of different systems, discussing the advantages and problems of different methods, outlining the main issues to take into account in general, while also attempting to build a perspective for the future of the field. We hope this will provide a fundamental platform of understanding for future Atomic Force Microscopy studies of solid-liquid interfaces at the nanoscale.

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Authors and Affiliations

  1. Department of Applied Physics, COMP Centre of Excellence, Aalto University School of Science, P.O. Box 11100, 00076, Helsinki, Finland

    Bernhard Reischl, Peter Spijker & Adam Foster

  2. WPI-AIMR Tohoku University, Sendai, 980-8577, Japan

    Filippo Federici Canova

  3. School of Mathematics and Physics, University of Lincoln, Brayford Pool, Lincoln, LN6 7TS, UK

    Matt Watkins

Authors
  1. Bernhard Reischl
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  2. Filippo Federici Canova
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  3. Peter Spijker
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  4. Matt Watkins
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  5. Adam Foster
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Corresponding author

Correspondence to Adam Foster .

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Editors and Affiliations

  1. Institute of Scientific and Industrial Research, Osaka University Nanoscience and Nanotechnology Center, Osaka, Ibaraki, Japan

    Seizo Morita

  2. Institute of Experimental and Applied Physics, University of Regensburg, Regensburg, Germany

    Franz J. Giessibl

  3. Department of Physics, University of Basel, Basel, Switzerland

    Ernst Meyer

  4. ERC Advanced Research Group "FURORE", University of Hamburg, Hamburg, Germany

    Roland Wiesendanger

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Reischl, B., Canova, F.F., Spijker, P., Watkins, M., Foster, A. (2015). Simulating Solid-Liquid Interfaces in Atomic Force Microscopy. In: Morita, S., Giessibl, F., Meyer, E., Wiesendanger, R. (eds) Noncontact Atomic Force Microscopy. NanoScience and Technology. Springer, Cham. https://doi.org/10.1007/978-3-319-15588-3_18

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