Abstract
Nanomaterials, dispersed in the form of colloids in solutions, particles (dry powders) or thin films, are characterized by various techniques. Although the techniques to be used would depend upon the type of material and information one needs to know, usually one is interested in first knowing the size, crystalline type, composition, thermal, chemical state, and properties like optical or magnetic properties. A list of various commonly used techniques and their utility can be found in Box 7.1.
In this chapter, we shall briefly outline some of the techniques from those mentioned in Box 7.1.
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Further Reading
T.A. Carlson, Photoelectron and Auger Electron Spectroscopy (Plenum Press, New York, 1978)
B.D. Cullity, S.R. Stock, Elements of X-Ray Diffraction, 3rd edn. (Prentice Hall, Upper Saddle River, 2001)
H.H. Willard, L.L. Merritt Jr., J.A. Dean, F.A. Settle, Instrumental Methods of Analysis, 7th edn. (CBS Publishers, New Delhi, India, 1986)
J.B. Wachtman, Z.H. Kalman, Characterization of Materials (Elsevier/Butterworth-Heineman, Boston, 1993)
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Kulkarni, S.K. (2015). Analysis Techniques. In: Nanotechnology: Principles and Practices. Springer, Cham. https://doi.org/10.1007/978-3-319-09171-6_7
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DOI: https://doi.org/10.1007/978-3-319-09171-6_7
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Online ISBN: 978-3-319-09171-6
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