Abstract
In reliability physics and engineering, the development and use of the acceleration factor is fundamentally important to the theory of accelerated testing. The acceleration factor permits one to take time-to-failure data very rapidly under accelerated stress conditions, and then to be able to extrapolate the accelerated time-to-failure results (into the future) for a given set of operational conditions.
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Notes
- 1.
Note: for the reliability engineer, this is very exciting because the acceleration factor permits one to effectively take a crystal-ball look into the future as to what will happen!.
- 2.
Time-to-failure for materials/devices is strongly process dependent. Small micro-structural differences in the material can lead to device-to-device variations producing different times-to-failure.
- 3.
- 4.
The fact that the AF depends only on the kinetics of failure (n, γ, Q) and not on device-to-device variation (due to slight materials/process differences) is very important. This means that, for a single failure mechanism, all devices of the time-to-failure distribution should be accelerated by the same amount.
- 5.
An example of the physics-of-failure changing can be easily found from electromigration-induced failure in aluminum metallizations (discussed in Chap. 11). At relatively low temperatures, the Al-ion transport is dominated by grain-boundary diffusion with activation energy Q gb. At much higher temperatures, the transport is dominated by bulk (within-grain or lattice) diffusion with activation energy Q bulk, where: Q bulk > Q gb.
Bibliography
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McPherson, J.: Reliability Physics and Engineering. In: Handbook of Semiconductor Manufacturing Technology, 2 CRC Press, 30–1 (2008).
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McPherson, J.W. (2013). Acceleration Factor Modeling. In: Reliability Physics and Engineering. Springer, Heidelberg. https://doi.org/10.1007/978-3-319-00122-7_9
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DOI: https://doi.org/10.1007/978-3-319-00122-7_9
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